Silicon AFM Tips

HQ:CSC37/No Al

AFM Probe with 3 Different Contact Mode AFM Cantilevers

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

40 kHz

20 kHz

30 kHz

C

0.8 N/m

0.3 N/m

0.4 N/m

L

250 µm

350 µm

300 µm

HQ:CSC38/No Al

AFM Probe with 3 Different Contact Mode AFM Cantilevers

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

20 kHz

10 kHz

14 kHz

C

0.09 N/m

0.03 N/m

0.05 N/m

L

250 µm

350 µm

300 µm

PPP-BSI

Soft Contact AFM Probe for Biological Applications

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

28 kHz

C

0.1 N/m

L

225 µm

AR10-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

AR5-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

AR5-NCH

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: none
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

NW-AR10-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

320 kHz

C

42 N/m

L

125 µm

NW-AR5-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

320 kHz

C

42 N/m

L

125 µm

AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

NW-AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

400 kHz

C

80 N/m

L

125 µm

CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

210 kHz

C

72 N/m

L

225 µm

NW-CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

400 kHz

C

80 N/m

L

125 µm

NW-CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

210 kHz

C

72 N/m

L

225 µm

PPP-NCHPt

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

ATEC-NCPt

Electrical, Tapping Mode AFM Probe with REAL Tip Visibility

Coating: Electrically Conductive
Tip Shape: Visible

AFM Cantilever:

F

335 kHz

C

45 N/m

L

160 µm

PPP-NCSTPt

Electrical, Soft Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

160 kHz

C

7.4 N/m

L

150 µm

PPP-NCLPt

Electrical, Tapping Mode AFM Probe with a Long AFM Cantilever

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

NCHPt

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

320 kHz

C

42 N/m

L

125 µm

ARROW-NCPt

Electrical, Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

Coating: Electrically Conductive
Tip Shape: Arrow

AFM Cantilever:

F

285 kHz

C

42 N/m

L

160 µm