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CDT-NCHR

Order Code / Price*

Quantity

CDT-NCHR-10 Box of 10 AFM Probes

1517 1517.00 EUR

Volume Discount Available [?]

CDT-NCHR-20 Box of 20 AFM Probes

2715 2715.00 EUR

Your volume discount is 319.00 EUR or 10.50%

CDT-NCHR-50 Box of 50 AFM Probes

5987 5987.00 EUR

Your volume discount is 1598.00 EUR or 21.10%

Product availability: On stock

SEM image of DT diamond coated AFM tip

Raman spectrum of diamond AFM tip coating

CDT-NCHR

Name: CDT-NCHR-10 Diamond Coated, Conductive Tapping Mode AFM Probe
Brand: NANOSENSORS
SKU: CDT-NCHR-10
Price: 1517 EUR
Availability: InStock

Diamond Coated, Conductive Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Diamond,Conductive Diamond
AFM tip shape: Standard

AFM Cantilever

F 400 kHz

C 80 N/m

L 125 µm

*nominal values

Applications

How to optimize AFM scan parameters

NANOSENSORS™ CDT-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic AFM tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

The AFM probe offers unique features:

real diamond coating, highly doped
high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

AFM Cantilever:

Shape: Beam

Force Constant: 80 N/m (23 - 225 N/m)*

Resonance Frequency: 400 kHz (225 - 610 kHz)*

Length: 125 µm (115 - 135 µm)*

Width: 30 µm (22.5 - 37.5 µm)*

Thickness: 4 µm ( 3 - 5 µm)*

* guaranteed range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.