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NW-AR10-NCHR

Order Code / Price*

Quantity

NW-AR10-NCHR-10 Box of 10 AFM Probes

1271 1271.00 EUR

Volume Discount Available [?]

NW-AR10-NCHR-20 Box of 20 AFM Probes

2276 2276.00 EUR

Your volume discount is 266.00 EUR or 10.50%

NW-AR10-NCHR-50 Box of 50 AFM Probes

5018 5018.00 EUR

Your volume discount is 1337.00 EUR or 21.00%

NW-AR10-NCHR-W Box of 380 AFM Probes

26358 26358.00 EUR

Your volume discount is 21940.00 EUR or 45.40%

Product availability: On stock

SEM images of AR10 high aspect ratio AFM tip

NW-AR10-NCHR

Name: NW-AR10-NCHR-10 High-Aspect-Ratio, Tapping Mode AFM Probe
Brand: NanoWorld
SKU: NW-AR10-NCHR-10
Price: 1271 EUR
Availability: InStock

High-Aspect-Ratio, Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: Reflective Aluminum
AFM tip shape: High-Aspect-Ratio

AFM Cantilever

F 320 kHz

C 42 N/m

L 125 µm

*nominal values

Applications

High Aspect Ratio (HAR) AFM Probes

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping™ mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.

These AFM probes offer unique features:

length of the high aspect ratio portion of the tip > 1.5 µm
typical aspect ratio of this portion in the order of 12:1 (when viewed from side as well as along cantilever axis)
half cone angle of the high aspect ratio portion typically < 2.8°
excellent tip radius of curvature

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

AFM Tip:

Shape: High-Aspect-Ratio

Radius: < 10 nm

AFM Cantilever:

Shape: Beam

Force Constant: 42 N/m (21 - 78 N/m)*

Resonance Frequency: 320 kHz (250 - 390 kHz)*

Length: 125 µm (120 - 130 µm)*

Width: 30 µm (25 - 35 µm)*

Thickness: 4 µm ( 3.5 - 4.5 µm)*

* typical range