Scanning Capacitance Microscopy and Piezoresponse Force Microscopy AFM Probes

HQ:DPE-XSC11

AFM Probe with 4 Different Electrical Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

155 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7 N/m

42 N/m

L

500 µm

210 µm

150 µm

100 µm

ElectriAll-In-One

Electrical AFM Probe with 4 Different AFM Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

150 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7.4 N/m

40 N/m

L

500 µm

210 µm

150 µm

100 µm

HQ:XSC11/Pt

AFM Probe with 4 Different Electrical Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

155 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7 N/m

42 N/m

L

500 µm

210 µm

150 µm

100 µm

PPP-CONTPt

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

ATEC-CONTPt

Electrical, Contact Mode AFM Probe with REAL Tip Visibility

Coating: Electrically Conductive
Tip Shape: Visible

AFM Cantilever:

F

15 kHz

C

0.2 N/m

L

450 µm

ARROW-CONTPt

Electrical, Contact Mode AFM Probe with Tip at the Very End of the Cantilever

Coating: Electrically Conductive
Tip Shape: Arrow

AFM Cantilever:

F

14 kHz

C

0.2 N/m

L

450 µm

CONTPt

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

ElectriCont-G

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

HQ:CSC37/Pt

AFM Probe with 3 Different Electrical, Contact Mode AFM Cantilevers

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

40 kHz

20 kHz

30 kHz

C

0.8 N/m

0.3 N/m

0.4 N/m

L

250 µm

350 µm

300 µm

SCM-PIC

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

SCM-PIT

Electrical, Force Modulation AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

ATEC-FMAu

Gold Coated Force Modulation AFM Probe with REAL Tip Visibility

Coating: Gold Overall
Tip Shape: Visible

AFM Cantilever:

F

85 kHz

C

2.8 N/m

L

240 µm

HQ:CSC17/Pt

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.18 N/m

L

450 µm

PPP-FMAu

Gold Coated Force Modulation AFM Probe

Coating: Gold Overall
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

PNP-TR-Au

Gold Coated Silicon Nitride AFM Probe

Coating: Gold Overall
Tip Shape: Pyramid

AFM Cantilevers: 2

1

2

F

67 kHz

17 kHz

C

0.32 N/m

0.08 N/m

L

100 µm

200 µm

HQ:NSC18/Cr-Au

Gold Coated Force Modulation AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

HQ:NSC19/Cr-Au

Gold Coated Force Modulation AFM Probe

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilever:

F

65 kHz

C

0.5 N/m

L

125 µm

HQ:NSC35/Cr-Au

AFM Probe with 3 Different Gold Coated Tapping Mode AFM Cantilevers

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

205 kHz

300 kHz

150 kHz

C

8.9 N/m

16 N/m

5.4 N/m

L

110 µm

90 µm

130 µm

HQ:NSC36/Cr-Au

AFM Probe with 3 Different Gold Coated Force Modulation Mode AFM Cantilevers

Coating: Gold Overall
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

90 kHz

130 kHz

65 kHz

C

1 N/m

2 N/m

0.6 N/m

L

110 µm

90 µm

130 µm

3XC-GG

AFM Probe with 3 Different Gold Coated AFM Cantilevers for Various Applications and AFM Tips at the Very End of the AFM Cantilevers

Coating: Gold Overall
Tip Shape: Optimized Positioning

AFM Cantilevers: 3

1

2

3

F

17 kHz

150 kHz

75 kHz

C

0.3 N/m

9 N/m

2.5 N/m

L

500 µm

175 µm

240 µm