Silicon AFM Support Chips

AFM probes with silicon support chips
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390 results
PPP-CONTSC
PPP-CONTSC
Contact Mode AFM Probe with Short AFM Cantilever
Coating: none
Tip Shape: Standard
AFM Cantilever:
F
25 kHz
C
0.2 N/m
L
225 µm
best of the best
PPP-MFMR
PPP-MFMR
Hard Magnetic, Medium Momentum MFM AFM Probe
Coating: Magnetic
Tip Shape: Standard
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
SSS-MFMR
SSS-MFMR
SuperSharp, Hard Magnetic, Low Momentum MFM AFM Probe
Coating: Magnetic
Tip Shape: Supersharp
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
the industry standard
MFMR
MFMR
Hard Magnetic, Medium Momentum MFM AFM Probe
Coating: Magnetic
Tip Shape: Standard
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
S-MFMR
S-MFMR
Soft Magnetic, Medium Momentum MFM AFM Probe
Coating: Magnetic
Tip Shape: Standard
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
top value
HQ:NSC18/Co-Cr/Al BS
HQ:NSC18/Co-Cr/Al BS
Hard Magnetic, Medium Momentum MFM AFM Probe
Coating: Magnetic
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
HQ:NSC36/Co-Cr/Al BS
HQ:NSC36/Co-Cr/Al BS
Hard Magnetic, Medium Momentum MFM AFM Probe with 3 Different AFM Cantilevers
Coating: Magnetic
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
60 kHz
130 kHz
65 kHz
C
1 N/m
2 N/m
0.6 N/m
L
110 µm
90 µm
130 µm
top value
240AC-MA
240AC-MA
Hard Magnetic, Medium Momentum AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating: Magnetic
Tip Shape: Optimized Positioning
AFM Cantilever:
F
70 kHz
C
2 N/m
L
240 µm
best bang for your buck
MagneticMulti75-G
MagneticMulti75-G
Hard Magnetic, Medium Momentum AFM Probe
Coating: Magnetic
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
PPP-NCH
PPP-NCH
Standard Tapping Mode AFM Probe
Coating: none
Tip Shape: Standard
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
PPP-NCL
PPP-NCL
Tapping Mode AFM Probe, Long AFM Cantilever
Coating: none
Tip Shape: Standard
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
NCH
NCH
Standard Tapping Mode AFM Probe
Coating: none
Tip Shape: Standard
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
TESP
TESP

Standard Tapping Mode AFM Probe

Coating: none
Tip Shape: Standard
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
ARROW-NC
ARROW-NC
Tapping Mode AFM Probe with Tip at the Very End of the Cantilever
Coating: none
Tip Shape: Arrow
AFM Cantilever:
F
285 kHz
C
42 N/m
L
160 µm
LTESP
LTESP

Tapping Mode AFM Probe, Long Cantilever

Coating: none
Tip Shape: Standard
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
NCL
NCL
Tapping Mode AFM Probe, Long Cantilever
Coating: none
Tip Shape: Standard
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
HQ:NSC15/No Al
HQ:NSC15/No Al
Standard Tapping Mode AFM Probe
Coating: none
Tip Shape: Rotated
AFM Cantilever:
F
325 kHz
C
40 N/m
L
125 µm
HQ:NSC16/No Al
HQ:NSC16/No Al
Tapping Mode AFM Probe with Long AFM Cantilever
Coating: none
Tip Shape: Rotated
AFM Cantilever:
F
190 kHz
C
45 N/m
L
225 µm
top value
3XC-NA
3XC-NA

AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM  Tips at the Very End of the AFM Cantilevers

Coating: Reflective Aluminum
Tip Shape: Optimized Positioning
AFM Cantilevers: 3
1
2
3
F
17 kHz
150 kHz
75 kHz
C
0.3 N/m
9 N/m
2.5 N/m
L
500 µm
175 µm
240 µm
160AC-NN
160AC-NN
Standard Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating: none
Tip Shape: Optimized Positioning
AFM Cantilever:
F
300 kHz
C
26 N/m
L
160 µm
20