Standard Force Modulation AFM Probe
NanoWorld Pointprobe® FM AFM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact AFM probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe.
All AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.
Additionally, this probe offers an excellent tip radius of curvature.
This AFM probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original AFM probe which has always been manufactured by NanoWorld®.
This AFM probe features alignment grooves on the back side of the holder chip.
