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PeakForce Kelvin Probe Force Microscopy AFM Probes
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PeakForce Kelvin Probe Force Microscopy AFM Probes

PeakForce Tapping® Kelvin probe force microscopy (PF-KPFM™) measurements of surface potential
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PPP-CONTPt NANOSENSORS
PPP-CONTPt
Electrical, Contact Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F
13 kHz
C
0.2 N/m
L
450 µm
CONTPt NanoWorld
CONTPt
Electrical, Contact Mode AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
AFM Cantilever:
F
13 kHz
C
0.2 N/m
L
450 µm
HQ:CSC37/Pt MikroMasch
HQ:CSC37/Pt
AFM Probe with 3 Different Electrical, Contact Mode AFM Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 3
1
2
3
F
40 kHz
20 kHz
30 kHz
C
0.8 N/m
0.3 N/m
0.4 N/m
L
250 µm
350 µm
300 µm
NANOSENSORS™ Special Developments List (SDL) NANOSENSORS
NANOSENSORS™ Special Developments List (SDL)
Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise
Coating: various
Tip Shape: various
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