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SiNi

Order Code / Price*

Quantity

SiNi-10 Box of 10 AFM Probes

235 235.00 EUR

Volume Discount Available [?]

SiNi-30 Box of 30 AFM Probes

650 650.00 EUR

Your volume discount is 55.00 EUR or 7.80%

SiNi-100 Box of 100 AFM Probes

2050 2050.00 EUR

Your volume discount is 300.00 EUR or 12.80%

SiNi-300 Box of 300 AFM Probes

4995 4995.00 EUR

Your volume discount is 2055.00 EUR or 29.10%

Product availability: On stock

SiNi Box of: max. 50 AFM Probes

Buy these AFM Probes together with other BudgetSensors AFM probes of your choice in a Budget Combo Box!

Top view SEM image of SiNi AFM cantilevers

SEM image of SiNi wedge (double) AFM tip

SiNi

Name: SiNi-10 Silicon Nitride AFM Probe with 2 Different AFM Cantilevers on Each Side of the Chip
Brand: BudgetSensors
SKU: SiNi-10
Price: 235 EUR
Availability: InStock

best bang for your buck

Silicon Nitride AFM Probe with 2 Different AFM Cantilevers on Each Side of the Chip

Manufacturer: BudgetSensors

Coating: Reflective Gold
AFM tip shape: Pyramid

This probe features 4 cantilevers

F 30 kHz

C 0.27 N/m

L 100 µm

F 10 kHz

C 0.06 N/m

L 200 µm

*nominal values

Applications

How to optimize AFM scan parameters

Special micromachined silicon nitride AFM probe for soft contact imaging. This AFM probe features

2 silicon nitride AFM cantilevers for soft contact mode with two different lengths and force constants mounted on each side of the holder chip
silicon nitride wedge AFM tips with radius less than 15 nm
overall AFM tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm
macroscopic half cone angle of 35°
450 micron thick silicon holder chip

The holder chip with dimensions 3.4 x 1.6 x 0.45 mm fits most commercial AFM systems Consistent high quality at a lower price!

Consistent high quality at a lower price!

Gold/Chromium on detector side of the cantilever, 70 nm thick

AFM Tip:

Shape: Pyramid

Height: 12 µm (10 - 14 µm)*

Radius: < 15 nm

Half Cone Angle: 35° (macroscopic)

4 AFM Cantilevers:

Short Cantilever

Shape: Triangle

Force Constant: 0.27 N/m

Resonance Frequency: 30 kHz

Length: 100 µm (90 - 110 µm)*

Width: 16 µm (11 - 21 µm)*

Thickness: 520 nm ( 470 - 570 nm)*

Long Cantilever

Shape: Triangle

Force Constant: 0.06 N/m

Resonance Frequency: 10 kHz

Length: 200 µm (190 - 210 µm)*

Width: 30 µm (25 - 35 µm)*

Thickness: 520 nm ( 470 - 570 nm)*

$Diffraction grating$

Diffraction grating

This is a topography image of a holographic, UV optimized, blazed diffraction grating with 2400 lines/mm. It is a good graphic illustration of how much further at the nanoscale Atomic Force Microscopy allows us to ‘see’ beyond what any optical device could. The ridges diffract visible and near-UV light. To light these ridges are perfectly flat. The AFM using a sharp BudgetSensors tip shows us that their surface is actually quite rough.

Scanned with a BudgetSensors SiNi AFM probe, long cantilever in contact mode, 3 micron scan size

Image courtesy of Dr. Yordan Stefanov, Innovative Solutions Bulgaria

Bacteria and imprints of bacteria in agar

Topography scan of bacteria and negative imprints thereof in dried potato agar

Scanned with a BudgetSensors SiNi AFM probe, long cantilever, 10 micron scan size

Image courtesy of Dr. Yordan Stefanov, Innovative Solutions Bulgaria