Q-SiNi

Special micromachined silicon nitride AFM probe for soft contact imaging. This AFM probe features:

• 2 different silicon nitride AFM cantilevers for soft contact mode imaging on each side of the holder chip
• silicon nitride wedge AFM tips with radius less than 15 nm
• overall AFM tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm
• macroscopic AFM tip half-cone angle of 35°

The standard silicon holder chip with dimensions 3.4 x 1.6 x 0.45 mm fits most commercial AFM systems

Consistent high quality at a lower price!