3.4 mm x 1.6 mm AFM Support Chips

HQ:NSC36/No Al

AFM Probe with 3 Different Force Modulation Mode AFM Cantilevers

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

90 kHz

130 kHz

65 kHz

C

1 N/m

2 N/m

0.6 N/m

L

110 µm

90 µm

130 µm

Multi75-G

Standard Force Modulation AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

3XC-NN

AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM  Tips at the Very End of the AFM Cantilevers

Coating: none
Tip Shape: Optimized Positioning

AFM Cantilevers: 3

1

2

3

F

17 kHz

150 kHz

75 kHz

C

0.3 N/m

9 N/m

2.5 N/m

L

500 µm

175 µm

240 µm

HQ:XSC11/No Al

AFM Probe with 4 Different Cantilevers for Various Applications

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

155 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7 N/m

42 N/m

L

500 µm

210 µm

150 µm

100 µm

All-In-One

AFM Probe with 4 Different AFM Cantilevers for Various Applications

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

150 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7.4 N/m

40 N/m

L

500 µm

210 µm

150 µm

100 µm

SSS-NCL

SuperSharp, Tapping Mode AFM Probe with Long AFM Cantilever

Coating: none
Tip Shape: Supersharp

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

NW-SSS-NCL

SuperSharp, Tapping Mode AFM Probe with Long Cantilever

Coating: none
Tip Shape: Supersharp

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

SSS-FM

SuperSharp, Force Modulation AFM Probe

Coating: none
Tip Shape: Supersharp

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

HiRes-C18/Cr-Au

High Resolution, Soft Tapping Mode AFM Probe

Coating: Reflective Gold
Tip Shape: Supersharp

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

HiRes-C14/Cr-Au

High Resolution, Soft Tapping Mode AFM Probe

Coating: Reflective Gold
Tip Shape: Supersharp

AFM Cantilever:

F

160 kHz

C

5 N/m

L

125 µm

SHR300

High Resolution Tapping Mode AFM Probe

Coating: Reflective Gold
Tip Shape: Supersharp

AFM Cantilever:

F

300 kHz

C

40 N/m

L

125 µm

SuperSharp Enhanced

Ultrasharp EBD AFM whisker for high-resolution, non-contact AFM

Coating: Reflective Aluminum
Tip Shape: Cone Shaped,Supersharp,EBD

AFM Cantilever:

F

320 kHz

C

40 N/m

L

120 µm

SuperSharpStandard-NCH

SuperSharp diamond-like EBD whisker for non-contact AFM

Coating: Reflective Aluminum
Tip Shape: Cone Shaped,Supersharp,EBD

AFM Cantilever:

F

330 kHz

C

40 N/m

L

125 µm

SuperSharp Enhanced-soft

Ultrasharp EBD AFM whisker for high-resolution, soft tapping AFM

Coating: Reflective Aluminum
Tip Shape: Cone Shaped,Supersharp,EBD

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

HQ:NSC16/Hard/Al BS

Long Scanning, DLC Hardened Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated

AFM Cantilever:

F

190 kHz

C

45 N/m

L

225 µm

HQ:NSC36/Hard/Al BS

AFM Probe with 3 Different Long Scanning, DLC Hardened Force Modulation Mode AFM Cantilevers

Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

90 kHz

130 kHz

65 kHz

C

1 N/m

2 N/m

0.6 N/m

L

110 µm

90 µm

130 µm

HQ:XSC11/Hard/Al BS

AFM Probe with 4 Different Long Scanning, DLC Hardened Cantilevers for Various Applications

Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

155 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7 N/m

42 N/m

L

500 µm

210 µm

150 µm

100 µm

Tap150DLC

Diamond-Like-Carbon Coated Soft Tapping Mode AFM Probe

Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated

AFM Cantilever:

F

150 kHz

C

5 N/m

L

125 µm

Tap190DLC

Diamond-Like-Carbon Coated Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

DT-CONTR

Diamond Coated Contact Mode AFM Probe

Coating: Diamond
Tip Shape: Standard

AFM Cantilever:

F

20 kHz

C

0.5 N/m

L

450 µm