AFM Probes  »  
 Request a quote (RFQ)
Order Code / Price*
Quantity
AIODLC-10 Box of 10 AFM Probes
380.00 USD
Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

All-In-One-DLC

Diamond-Like-Carbon Coated AFM Probe with 4 Different AFM Cantilevers for Various Applications

Manufacturer: BudgetSensors

Coating: Hard Diamond-Like-Carbon
AFM tip shape: Rotated
This probe features 4 cantilevers
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 200 µm
F 150 kHz
C 7.4 N/m
L 150 µm
F 350 kHz
C 40 N/m
L 100 µm
*nominal values
Applications
How to optimize AFM scan parameters gear icon

Versatile micromachined monolithic silicon AFM probe with 4 different AFM cantilevers on a single holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode.

The main advantage of the All-In-One series compared to single-cantilever AFM probes is the freedom to choose the right AFM cantilever for each application on the fly, thus avoiding the need to stock various AFM probe types.

High durability and hydrophobicity thanks to a thin diamond-like-carbon (DLC) coating on tip side of the AFM cantilever. The consistent AFM tip radius of less than 15 nm ensures high resolution and good reproducibility. The rotated AFM tips provide more symmetric representation of high sample features.

The AFM probe features a reflective aluminum coating on the back side of the AFM cantilevers. It is not suitable for measurements in liquids.

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems. There are 2 AFM cantilevers on each end of the chip. The end of the chip with the two shorter, stiffer and higher resonance frequency AFM cantilevers is marked by a trapezoidal pattern visible with the naked eye.

Consistent high quality at a lower price!

Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;Aluminum coating on detector side of the cantilever, 30 nm thick
AFM Tip:

  • 4 AFM Cantilevers:
    Cantilever A - Contact Mode
  • Beam
  • 0.2 N/m (0.04 - 0.7 N/m)*
  • 15 kHz (10 - 20 kHz)*
  • 500 µm (490 - 510 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm ( 1.7 - 3.7 µm)*
  • Cantilever B - Force Modulation
  • Beam
  • 2.7 N/m (0.4 - 10 N/m)*
  • 80 kHz (50 - 110 kHz)*
  • 200 µm (200 - 220 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm ( 1.7 - 3.7 µm)*
  • Cantilever C - Soft Tapping
  • Beam
  • 7.4 N/m (1 - 29 N/m)*
  • 150 kHz (70 - 230 kHz)*
  • 150 µm (140 - 160 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm ( 1.7 - 3.7 µm)*
  • Cantilever D - Tapping Mode
  • Beam
  • 40 N/m (7 - 160 N/m)*
  • 350 kHz (200 - 500 kHz)*
  • 100 µm (90 - 110 µm)*
  • 50 µm (45 - 55 µm)*
  • 2.7 µm ( 1.7 - 3.7 µm)*
  • * typical range
    Loading
    nanosensors-logo
    nanoworld-logo
    budgetsensors-logo
    mikromasch-logo
    opus-logo
    sqube-logo
    nanotools-logo