Standard Non-Rotated AFM Tips

AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

NW-AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

400 kHz

C

80 N/m

L

125 µm

CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

210 kHz

C

72 N/m

L

225 µm

NW-CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

400 kHz

C

80 N/m

L

125 µm

NW-CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

210 kHz

C

72 N/m

L

225 µm

PPP-NCHPt

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

PPP-NCSTPt

Electrical, Soft Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

160 kHz

C

7.4 N/m

L

150 µm

PPP-NCLPt

Electrical, Tapping Mode AFM Probe with a Long AFM Cantilever

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

NCHPt

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

320 kHz

C

42 N/m

L

125 µm

NCLPt

Electrical, Tapping Mode AFM Probe with a Long Cantilever

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

PPP-CONTPt

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

PPP-CONTSCPt

Electrical, Contact Mode AFM Probe with Short AFM Cantilever

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

25 kHz

C

0.2 N/m

L

225 µm

CONTPt

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

SCM-PIC

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

SCM-PIT

Electrical, Force Modulation AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

PPP-FMAu

Gold Coated Force Modulation AFM Probe

Coating: Gold Overall
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

EBD-HAR

Universal high-aspect ratio EBD AFM whisker for enhanced resolution, imaging stability and AFM tip lifetime

Coating: none
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD

AFM Cantilever:

F

330 kHz

C

40 N/m

L

125 µm

EBD-AR20T

High-aspect ratio, tilt compensated EBD AFM whisker for automated non-contact AFM

Coating: none
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD

AFM Cantilever:

F

330 kHz

C

40 N/m

L

125 µm

PPP-CONTAu

Gold Coated Contact Mode AFM Probe

Coating: Gold Overall
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm