Electron-beam lithography of nanostructures at the tips of scanning probe cantileversFri Feb 16 2024
It is always exiting to see what our creative and innovative users are doing with our AFM probes.
In their article “Electron-beam lithography of nanostructures at the tips of scanning probe cantilevers” L. Forrer, A. Kamber, A. Knoll, M. Poggio and F. R. Braakman describe how they developed a process to fabricate nanoscale metallic gate electrodes on scanning probe cantilevers. *
They even patterned the very fragile tip of the NANOSENSORS AdvancedTEC ATEC-NC with a gate array defined through the etching process. *
Their method allows the patterning of nanoscale devices on fragile scanning probes, extending their functionality as sensors. *
Please have a look at the NANOSENSORS blog for the full citation and a direct link to the full article.
HAPPY NEW LUNAR YEAR OF THE DRAGONWed Feb 14 2024
Happy New Lunar Year of the Dragon!
We wish everyone a good start into the new lunar year of the dragon.
Happy New Lunar Year of the Dragon!Wed Feb 14 2024
NANOSENSORS™ AFM probes wishes you all a happy, healthy and successful new lunar year of the dragon.
MagneticMulti75-G AFM probes used in a studyThu Feb 08 2024
Investigation of the formation of stripe domains in electrodeposited magnetoelastic Ni90Fe10 thin films with the help of our MagneticMulti75-G AFM probes
Lock-in Amplifier Based Peak Force Infrared MicroscopyMon Jan 15 2024
Lock-in Amplifier Based Peak Force Infrared Microscopy
“[T]he current PFIR microscope requires customized hardware configuration and software programming for real-time signal acquisition and processing, which creates a high barrier to PFIR implementation. In this communication, we describe a type of lock-in amplifier-based PFIR microscopy that can be assembled with generic, commercially available equipment without special hardware or software programming.”
The measurements in PeakForce Infrared Microscopy mode are performed using our platinum coated HQ:NSC15/Pt AFM probes.
Happy Holidays from NANOSENSORS™ AFM probesSun Dec 24 2023
With this seasonal Special Development Christmas Tree AFM tip with a light snow coating, we would like to wish all users of our AFM probes Happy Holidays and a good start into the New Year!
We are looking forward to another year with you.
Season’s Greetings from the whole NanoWorld® team!Sat Dec 23 2023
Christmas cheer can be found in the tinies of places if you look hard enough. Enjoy the holiday season with your friends and family and see you next year.
Merry Christmas and a Happy New Year! May 2024 be your best year yet!Fri Dec 22 2023
The MikroMasch team wishes you a Merry Christmas and a Happy New Year! May 2024 be your best year yet!
Merry Christmas and Happy New YearFri Dec 22 2023
Happy Holiday Season from BudgetSensors! All the best to you in 2024!
#AFM #AFMProbes #AtomicForceMicroscopy #AFMtips #Holidays #christmastree
Video-Rate High-Speed-AFM To Study Permeability Barrier Within Yeast Nuclear Pore ComplexesThu Dec 14 2023
Discover how nanotools QUANTUM-AC10 (Soft & Sharp) with 0.1N/m cantilevers and 2-3nm radius are applied for video-rate HS-AFM imaging of nuclear pore complexes.
https://www.nanotools.com/blog/video-rate-high-speed-afm-to-study-permeability-barrier-within-yeast-nuclear-pore-complexes.html
Title: Dynamic molecular mechanism of the nuclear pore complex permeability barrier
Authors: Toshiya Kozai, Javier Fernandez-Martinez, Trevor van Eeuwen, Paola Gallardo, Larisa E. Kapinos, Adam Mazur, Wenzhu Zhang, Jeremy Tempkin, Radhakrishnan Panatala, Maria Delgado-Izquierdo, Barak Raveh, Andrej Sali, Brian T. Chait, Liesbeth M. Veenhoff, Michael P. Rout, Roderick Y. H. Lim
Publication: bioRxiv
Pubisher: Cold Spring Harbor Laboratory
Date: April 14, 2023
Last exhibition day at 2023 MRS Fall Meeting & ExhibitThu Nov 30 2023
Last exhibition day at 2023 MRS Fall Meeting & Exhibit Materials Research Society and the last day to have a look at our 3D printed #AFMtip scale models, find out about the many different #AFMprobes we offer and pick up some Swiss chocolate.
Opening hours today Thursday, November 30 10:00 am – 1:00 pm
Did you know that we now also sell the original Olympus AFM probes?Wed Nov 29 2023
It’s the second exhibition day at 2023 MRS Fall.
Did you know that we now also sell the original Olympus #AFMprobes?
Visit us today at booth # 904 to find out more.
Opening times Wednesday, November 29 10:00 am – 6:00 pm
NanoWorld at MRS Fall Meeting & Exhibit 2023 this weekTue Nov 28 2023
NanoWorld CEO Manfred Detterbeck is in Boston for the MRS Fall 2023 Meeting & Exhibit this week.
Will you be there too? You’ll meet him at some of the sessions or at NanoAndMore USA booth no. 904.
NanoAndMore at MRS Fall Meeting and Exhibit in BostonMon Nov 27 2023
We're all set up and exited to be able to welcome you at this year's MRS Fall Meeting and Exhibit in Boston.
Exhibition hours tomorrow Tuesday, November 28 11:00 am – 6:00 pm
See you soon!
E-AFM Nanolithography Approach Enables High-Resolution NanopatterningThu Nov 23 2023
Discover how nanotools 500nm long, tilt compensated, high aspect ratio MCNT-500™ is applied for imaging and characterization of lithography features dimensions (depth and width).
https://www.nanotools.com/blog/e-afm-nanolithography-approach-enables-high-resolution-nanopatterning.html
Title: Electric-Field-Assisted Contact Mode Atomic Force Microscope-Based Nanolithography With Low Stiffness Conductive Probes
Authors: Zhou, H., Jiang, Y., Dmuchowski, C. M., Ke, C., and Deng, J.
Publication: Journal of Micro- and Nano-Manufacturing
Publisher: ASME International
Date: 28 April 2022
MikroMasch XSC11/Al BS AFM probes support the investigation of flexible magnetic films derived from bacterial nanocelluloseMon Nov 20 2023
The light tapping mode cantilevers of our 4-lever MikroMasch XSC11/Al BS AFM probes support the investigation of flexible magnetic films derived from bacterial nanocellulose.
NanoAndMore Europe booth at Operando SPM 2023 at the Fritz Haber Institute of the Max Planck SocietySun Nov 19 2023
Thank you for visiting the NanoAndMore Europe booth at Operando SPM 2023 at the Fritz Haber Institute of the Max Planck Society this week where we were one of the proud sponsors. We hope to see you again to talk more about what kind of #AFMprobes you need for your #atomicforcemicroscopy application.
NanoAndMore Japan CEO Nobuhiro Saito and NanoWorld CEO Manfred Detterbeck visited the Nano Life Science Institute at Kanazawa UniversityThu Nov 09 2023
NanoAndMore Japan CEO Nobuhiro Saito and NanoWorld CEO Manfred Detterbeck visited the Nano Life Science Institute at Kanazawa University today to discuss their needs for #AFMprobes for #highspeedatomicforcemicroscopy ( #HSAFM ) and all the other applications the many active researchers there are working on.
Imaging of nanoscale charge dynamics demonstrated with BudgetSensors Multi75-G AFM probesThu Nov 09 2023
Researchers at the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory have developed a novel high-speed sparse scanning Kelvin probe force microscopy (SS-KPFM) technique which allows sub-second imaging of nanoscale charge dynamics demonstrated with BudgetSensors Multi75-G AFM probes. Measurements on BudgetSensors KPFM & EFM Sample reveal improvement in resolution over classical amplitude modulated KPFM.
Happy HalloweenTue Oct 31 2023
Do you remember our 30th anniversary when we gave away the free NANOSENSORS #fungratings?
#Halloween is here again and it is time to let the creepy, crawly creatures, monsters and others escape from the NANOSENSORS fun grating in the lab again.
Our Jack O’Lanterns are two examples. There are many more to discover.
Share with us what you’ve discovered while scanning your fun grating with your #atomicforcemicroscope.
Happy Halloween!
Highlights
AFM Probe Focus
best of the best
qp-HBC
uniqprobe™ - HeartBeat Cantilever for ScanAsyst®** and Peak Force Tapping™**
Coating:
Reflective Aluminum
Tip Shape: Circular symmetric
Tip Shape: Circular symmetric
AFM Cantilever:
F
60 kHz
C
0.5 N/m
L
115 µm
ATEC-NC
Tapping Mode AFM Probe with REAL Tip Visibility
Coating:
none
Tip Shape: Visible
Tip Shape: Visible
AFM Cantilever:
F
335 kHz
C
45 N/m
L
160 µm
TESPA
Standard Tapping Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
OTESPA
Standard Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating:
Reflective Aluminum
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilever:
F
300 kHz
C
26 N/m
L
160 µm
