PPP-ZEIHR

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

For owners of the ZEISS Veritekt microscope using the step mode (non-contact mode) we recommend NANOSENSORS™ PPP-ZEIHR AFM tips (Zeiss / high force constant). Compared with the PPP-NCH and PPP-NCL AFM probes the force constant is reduced and the resonance frequency is lower.

The AFM probe offers unique features:

• excellent AFM tip radius of curvature
• highly doped silicon to dissipate static charge
• Al coating on detector side of AFM cantilever
• high mechanical Q-factor for high sensitivity
• precise alignment of the AFM cantilever position (within +/-2µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.