AFM Probes »

PPP-ZEIHR

Order Code / Price*

Quantity

PPP-ZEIHR-10 Box of 10 AFM Probes

328 328.00 EUR

Volume Discount Available [?]

PPP-ZEIHR-20 Box of 20 AFM Probes

587 587.00 EUR

Your volume discount is 69.00 EUR or 10.50%

PPP-ZEIHR-50 Box of 50 AFM Probes

1296 1296.00 EUR

Your volume discount is 344.00 EUR or 21.00%

PPP-ZEIHR-W Box of 380 AFM Probes

6802 6802.00 EUR

Your volume discount is 5662.00 EUR or 45.40%

Product availability: Available on demand. Please contact us for availability!

Front view SEM image of PointProbe® Plus AFM tip

Close-up view SEM image of PointProbe® Plus AFM tip

PPP-ZEIHR

Name: PPP-ZEIHR-10 Special Tapping Mode AFM Probe
Brand: NANOSENSORS
SKU: PPP-ZEIHR-10
Price: 328 EUR
Availability: InStock

Special Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Reflective Aluminum
AFM tip shape: Standard

AFM Cantilever

F 130 kHz

C 27 N/m

L 225 µm

*nominal values

Applications

Non-Contact / Standard Tapping Mode AFM Probes

How to optimize AFM scan parameters

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

For owners of the ZEISS Veritekt microscope using the step mode (non-contact mode) we recommend NANOSENSORS™ PPP-ZEIHR AFM tips (Zeiss / high force constant). Compared with the PPP-NCH and PPP-NCL AFM probes the force constant is reduced and the resonance frequency is lower.

The AFM probe offers unique features:

excellent AFM tip radius of curvature
highly doped silicon to dissipate static charge
Al coating on detector side of AFM cantilever
high mechanical Q-factor for high sensitivity
precise alignment of the AFM cantilever position (within +/-2µm) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 7 nm (< 10 nm guaranteed)

AFM Cantilever:

Shape: Beam

Force Constant: 27 N/m (10 - 60 N/m)*

Resonance Frequency: 130 kHz (98 - 177 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 57 µm (50 - 65 µm)*

Thickness: 5 µm ( 4 - 6 µm)*

* guaranteed range