PPP-SEIH

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIH AFM probes (Seiko Instruments / high force constant).

The AFM probe offers unique features:

• excellent AFM tip radius of curvature
• highly doped silicon to dissipate static charge
• chemically inert
• high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.