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Quantity
PPP-SEIH-10 Box of 10 AFM Probes
328.00 EUR
PPP-SEIH-50 Box of 50 AFM Probes
1296.00 EUR
Your volume discount is 344.00 EUR or 21.00%
PPP-SEIH-W Box of 380 AFM Probes
6802.00 EUR
Your volume discount is 5662.00 EUR or 45.40%
Product availability: On stock

PPP-SEIH

Special Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: none
AFM tip shape: Standard
AFM Cantilever
F 130 kHz
C 15 N/m
L 225 µm
*nominal values
Applications
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The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORSPPP-SEIH AFM probes (Seiko Instruments / high force constant).

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.

Uncoated
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 15 N/m (5 - 37 N/m)*
  • 130 kHz (96 - 175 kHz)*
  • 225 µm (215 - 235 µm)*
  • 33 µm (25 - 40 µm)*
  • 5 µm ( 4 - 6 µm)*
  • * guaranteed range
    Interested in learning about how this AFM probe has been used by fellow researchers?
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