Silicon AFM Tips

SEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm

PPP-XYNCHR

Tapping Mode AFM Probe with Special Alignment System

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

PPP-XYNCSTR

Soft Tapping Mode AFM Probe with Special Alignment System

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

160 kHz

C

7.4 N/m

L

150 µm

SSS-SEIHR

SuperSharp, Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Supersharp

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm

SSS-SEIH

SuperSharp, Special Tapping Mode AFM Probe

Coating: none
Tip Shape: Supersharp

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm

NW-SSS-SEIH

SuperSharp, Special Tapping Mode AFM Probe

Coating: none
Tip Shape: Supersharp

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm

PPP-ZEILR

Special Contact Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

27 kHz

C

1.6 N/m

L

450 µm

ZEILR

Special Contact Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

27 kHz

C

1.6 N/m

L

450 µm

PPP-XYCONTR

Contact Mode AFM Probe with Special Alignment System

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

New

BL-AC40TS

Tapping Mode AFM Probe for High-Speed Scanning in Liquids

Coating: Reflective Gold
Tip Shape: Optimized Positioning

AFM Cantilever:

F

110 kHz

C

0.1 N/m

L

38 µm

Q-WM190-SSS

Premounted, SuperSharp Tapping Mode AFM Probe with Long AFM Cantilever, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Supersharp

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

Q-AR5

Premounted High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

Q-WM300

Premounted Standard Tapping Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

300 kHz

C

40 N/m

L

125 µm

Q-CONT

Premounted Standard Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

Q-EFM

Premounted Electrical, Force Modulation AFM Probe, for Quesant/Ambios AFM systems

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

Q-MFM

Premounted Hard Magnetic, Medium Momentum MFM AFM Probe, for Quesant/Ambios AFM systems

Coating: Magnetic
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

Q-Cond-E

Premounted Electrical, Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

Q-WM75

Premounted Standard Force Modulation AFM Probe, for Quesant/Ambios AFM Systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

Q-WM150

Premounted Soft Tapping Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

150 kHz

C

5 N/m

L

125 µm

best bang for your buck

Q-WM190

Premounted Tapping Mode AFM Probe with Long AFM Cantilever, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm