Back Side Aluminum Coated AFM Cantilevers

AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

NW-AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

400 kHz

C

80 N/m

L

125 µm

CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

210 kHz

C

72 N/m

L

225 µm

NW-CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

400 kHz

C

80 N/m

L

125 µm

NW-CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

210 kHz

C

72 N/m

L

225 µm

M-CIS

EBD AFM whisker for non-contact AFM microlens contact image sensor (CIS) inspection

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD

AFM Cantilever:

F

320 kHz

C

40 N/m

L

120 µm

EBD-AR20T

High-aspect ratio, tilt compensated EBD AFM whisker for automated non-contact AFM

Coating: none
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD

AFM Cantilever:

F

330 kHz

C

40 N/m

L

125 µm

SSS-QMFMR

SuperSharp, Hard Magnetic, Low Momentum MFM AFM Probe with a High Mechanical Q-Factor

Coating: Magnetic
Tip Shape: Supersharp

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

PPP-LM-MFMR

Hard Magnetic, Low Momentum MFM AFM Probe

Coating: Magnetic
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

PPP-LC-MFMR

Soft Magnetic, Medium Momentum MFM AFM Probe

Coating: Magnetic
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

PPP-QLC-MFMR

Soft Magnetic, Medium Momentum MFM AFM Probe with a High Mechanical Q-Factor

Coating: Magnetic
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

HQ:NSC35/tipless/Al BS

Tipless AFM Probe with 3 Different Tapping Mode AFM Cantilevers

Coating: Reflective Aluminum
Tip Shape: Tipless

AFM Cantilevers: 3

1

2

3

F

205 kHz

300 kHz

150 kHz

C

8.9 N/m

16 N/m

5.4 N/m

L

110 µm

90 µm

130 µm

HQ:NSC36/tipless/Al BS

Tipless AFM Probe with 3 Different Force Modulation AFM Cantilevers

Coating: Reflective Aluminum
Tip Shape: Tipless

AFM Cantilevers: 3

1

2

3

F

90 kHz

130 kHz

65 kHz

C

1 N/m

2 N/m

0.6 N/m

L

110 µm

90 µm

130 µm

HQ:CSC37/tipless/Al BS

Tipless AFM Probe with 3 Different Contact Mode AFM Cantilevers

Coating: Reflective Aluminum
Tip Shape: Tipless

AFM Cantilevers: 3

1

2

3

F

40 kHz

20 kHz

30 kHz

C

0.8 N/m

0.3 N/m

0.4 N/m

L

250 µm

350 µm

300 µm

HQ:CSC38/tipless/Al BS

Tipless AFM Probe with 3 Different Contact Mode AFM Cantilevers

Coating: Reflective Aluminum
Tip Shape: Tipless

AFM Cantilevers: 3

1

2

3

F

20 kHz

10 kHz

14 kHz

C

0.09 N/m

0.03 N/m

0.05 N/m

L

250 µm

350 µm

300 µm

All-In-One-Al-Tipless

Tipless AFM Probe with 4 Different AFM Cantilevers for Various Applications

Coating: Reflective Aluminum
Tip Shape: Tipless

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

150 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7.4 N/m

40 N/m

L

500 µm

210 µm

150 µm

100 µm

SuperSharpStandard-FM

SuperSharp diamond-like EBD AFM whisker for soft tapping AFM

Coating: Reflective Aluminum
Tip Shape: Cone Shaped,Supersharp,EBD

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

PPP-ZEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

27 N/m

L

225 µm

PPP-SEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm