Non-Contact / Soft Tapping Mode AFM Probes

HQ:NSC36/Al BS

AFM Probe with 3 Different Force Modulation Mode AFM Cantilevers

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

90 kHz

130 kHz

65 kHz

C

1 N/m

2 N/m

0.6 N/m

L

110 µm

90 µm

130 µm

240AC-NN

Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Coating: none
Tip Shape: Optimized Positioning

AFM Cantilever:

F

70 kHz

C

2 N/m

L

240 µm

Tap150-G

Soft Tapping Mode AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

150 kHz

C

5 N/m

L

125 µm

PPP-FM

Standard Force Modulation AFM Probe

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

FM

Standard Force Modulation AFM Probe

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

ARROW-FM

Force Modulation AFM Probe with Tip at the Very End of the Cantilever

Coating: none
Tip Shape: Arrow

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

240 µm

HQ:NSC14/No Al

Soft Tapping Mode AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

160 kHz

C

5 N/m

L

125 µm

HQ:NSC18/No Al

Standard Force Modulation AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

HQ:NSC19/No Al

Standard Force Modulation AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

65 kHz

C

0.5 N/m

L

125 µm

HQ:NSC35/No Al

AFM Probe with 3 Different Tapping Mode AFM Cantilevers

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

205 kHz

300 kHz

150 kHz

C

8.9 N/m

16 N/m

5.4 N/m

L

110 µm

90 µm

130 µm

HQ:NSC36/No Al

AFM Probe with 3 Different Force Modulation Mode AFM Cantilevers

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

90 kHz

130 kHz

65 kHz

C

1 N/m

2 N/m

0.6 N/m

L

110 µm

90 µm

130 µm

Multi75-G

Standard Force Modulation AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

3XC-NN

AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM  Tips at the Very End of the AFM Cantilevers

Coating: none
Tip Shape: Optimized Positioning

AFM Cantilevers: 3

1

2

3

F

17 kHz

150 kHz

75 kHz

C

0.3 N/m

9 N/m

2.5 N/m

L

500 µm

175 µm

240 µm

HQ:XSC11/No Al

AFM Probe with 4 Different Cantilevers for Various Applications

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

155 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7 N/m

42 N/m

L

500 µm

210 µm

150 µm

100 µm

All-In-One

AFM Probe with 4 Different AFM Cantilevers for Various Applications

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 4

1

2

3

4

F

15 kHz

80 kHz

150 kHz

350 kHz

C

0.2 N/m

2.7 N/m

7.4 N/m

40 N/m

L

500 µm

210 µm

150 µm

100 µm

4XC-NN

AFM Probe with 4 Different AFM Cantilevers with AFM Tips at the Very End of the AFM Cantilevers

Coating: none
Tip Shape: Optimized Positioning

AFM Cantilevers: 4

1

2

3

4

F

17 kHz

75 kHz

150 kHz

1200 kHz

C

0.3 N/m

2.5 N/m

9 N/m

100 N/m

L

500 µm

240 µm

175 µm

65 µm

PPP-SEIH

Special Tapping Mode AFM Probe

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm

PPP-SEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm

SEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm

PPP-XYNCSTR

Soft Tapping Mode AFM Probe with Special Alignment System

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

160 kHz

C

7.4 N/m

L

150 µm