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The 3XC series of AFM probes features three different AFM cantilevers for various measurement modes:
The uncoated AFM probes offer sharp AFM tip apexes, chemical inertness and high AFM cantilever quality factors.
The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface.