315 µm Thick AFM Support Chips

PPP-CONTSCAuD

Gold Coated Contact Mode AFM Probe with Short AFM Cantilever

Coating: Reflective Gold
Tip Shape: Standard

AFM Cantilever:

F

25 kHz

C

0.2 N/m

L

225 µm

ContGD-G

Gold Coated Contact Mode AFM Probe

Coating: Reflective Gold
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

HQ:CSC17/Cr-Au BS

Gold Coated Contact Mode AFM Probe

Coating: Reflective Gold
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.18 N/m

L

450 µm

HQ:CSC37/No Al

AFM Probe with 3 Different Contact Mode AFM Cantilevers

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

40 kHz

20 kHz

30 kHz

C

0.8 N/m

0.3 N/m

0.4 N/m

L

250 µm

350 µm

300 µm

HQ:CSC38/No Al

AFM Probe with 3 Different Contact Mode AFM Cantilevers

Coating: none
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

20 kHz

10 kHz

14 kHz

C

0.09 N/m

0.03 N/m

0.05 N/m

L

250 µm

350 µm

300 µm

PPP-BSI

Soft Contact AFM Probe for Biological Applications

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

28 kHz

C

0.1 N/m

L

225 µm

top value

160AC-FG

High Aspect Ratio, Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Coating: Reflective Gold
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

300 kHz

C

26 N/m

L

160 µm

New

240AC-FG

High Aspect Ratio, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Coating: Reflective Gold
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

70 kHz

C

2 N/m

L

240 µm

EBD-AR15T

High-aspect ratio, tilt compensated EBD AFM whisker for automated non-contact AFM

Coating: none
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD

AFM Cantilever:

F

330 kHz

C

40 N/m

L

125 µm

AR10-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

AR5-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

AR5-NCH

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: none
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

NW-AR10-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

320 kHz

C

42 N/m

L

125 µm

NW-AR5-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

320 kHz

C

42 N/m

L

125 µm

AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

NW-AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever

Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

400 kHz

C

80 N/m

L

125 µm

CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long AFM Cantilever

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

210 kHz

C

72 N/m

L

225 µm

NW-CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

400 kHz

C

80 N/m

L

125 µm

NW-CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

AFM Cantilever:

F

210 kHz

C

72 N/m

L

225 µm