3-sided Sharpened Pyramidal AFM Tips

PPP-LC-MFMR

Soft Magnetic, Medium Momentum MFM AFM Probe

Coating: Magnetic
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

PPP-QLC-MFMR

Soft Magnetic, Medium Momentum MFM AFM Probe with a High Mechanical Q-Factor

Coating: Magnetic
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

best of the best

Akiyama-Probe

Novel self-sensing, self-actuating AFM probe for dynamic mode AFM

Coating: none
Tip Shape: Visible

AFM Cantilever:

F

45 kHz

C

5 N/m

L

310 µm

PPP-ZEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

27 N/m

L

225 µm

ZEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

27 N/m

L

225 µm

PPP-SEIH

Special Tapping Mode AFM Probe

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm

PPP-SEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm

SEIHR

Special Tapping Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

130 kHz

C

15 N/m

L

225 µm

PPP-XYNCHR

Tapping Mode AFM Probe with Special Alignment System

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

PPP-XYNCSTR

Soft Tapping Mode AFM Probe with Special Alignment System

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

160 kHz

C

7.4 N/m

L

150 µm

PPP-ZEILR

Special Contact Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

27 kHz

C

1.6 N/m

L

450 µm

ZEILR

Special Contact Mode AFM Probe

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

27 kHz

C

1.6 N/m

L

450 µm

PPP-XYCONTR

Contact Mode AFM Probe with Special Alignment System

Coating: Reflective Aluminum
Tip Shape: Standard

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

Q-WM300

Premounted Standard Tapping Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

300 kHz

C

40 N/m

L

125 µm

Q-CONT

Premounted Standard Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

Q-EFM

Premounted Electrical, Force Modulation AFM Probe, for Quesant/Ambios AFM systems

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

Q-MFM

Premounted Hard Magnetic, Medium Momentum MFM AFM Probe, for Quesant/Ambios AFM systems

Coating: Magnetic
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

Q-Cond-E

Premounted Electrical, Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Electrically Conductive
Tip Shape: Rotated

AFM Cantilever:

F

13 kHz

C

0.2 N/m

L

450 µm

Q-WM75

Premounted Standard Force Modulation AFM Probe, for Quesant/Ambios AFM Systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

Q-WM150

Premounted Soft Tapping Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflective Aluminum
Tip Shape: Rotated

AFM Cantilever:

F

150 kHz

C

5 N/m

L

125 µm