By simply buying larger package sizes of Advanced Surface Microscopy, Inc. AFM probes, you automatically get a built-in quantity discount compared to the smallest packaging size.
302-edu
Student Grade Calibration Specimen, 2-dimensional, 297nm Nominal Period, Aluminum Bumps on Si
Product Description
302-edu. Student grade Calibration specimen, 2-dimensional, 297 nm nominal period, Aluminum bumps on Si
Default mounting: Unmounted.
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