By simply buying larger package sizes of Advanced Surface Microscopy, Inc. AFM probes, you automatically get a built-in quantity discount compared to the smallest packaging size.
300-2D
Calibration Specimen, 2-dimensional, 297nm Nominal Period, Aluminum Bumps on Si
Product Description
300-2D Calibration specimen, 2-dimensional, 297 nm nominal period (refer to certificate for actual period), Aluminum bumps on Si
Substrate: Silicon about 4x3 mm Default mounting: On 12 or 15 mm diameter steel disk. Available unmounted on request
Available mounted on SEM stub (300-2D-SEM) Default mounting: on pin stub type A using colloidal graphite paint. Colloidal silver paint or adhesive carbon tab available on request. Carbon tab not recommended for pitch < 500 nm. See mount descriptions.
Available as miniature version with die size about 0.9x0.9 mm (300-2D-Mini). Sold unmounted only. Recommended for applications where low mass and/or small size are advantageous.
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