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150-2D

Calibration Specimen, 2-dimensional, 144nm Nominal Period, Al on Si

Product Description

150-2D Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on Si.

Substrate: Silicon about 4x3 mm

Default mounting: On 12 or 15 mm diameter steel disk. Available unmounted on request.

Available mounted on SEM stub (150-2D-SEM)
Default mounting: on pin stub type A using colloidal graphite paint. 
Colloidal silver paint or adhesive carbon tab available on request.
Carbon tab not recommended for pitch < 500 nm.
See mount descriptions.

Available as miniature version with die size about 0.9x0.9 mm (300-2D-Mini).
Sold unmounted only. Recommended for applications where low mass and/or small size are advantageous.

Available as a traceable calibration specimen (150-2DUTC).

Re-Calibration traceable to National Laboratory available for $4910.
Recertification policy: we do not clean the specimens. If our inspection shows that the specimen is not in good enough condition for recertification, we will offer you a new specimen at 80% of the original price.

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