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qp-BioAC-10 Box of 10 AFM Probes
415.00 USD
qp-BioAC-50 Box of 50 AFM Probes
1622.00 USD
Your volume discount is 453.00 USD or 21.80%
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qp-BioAC

best of the best

uniqprobe™ - uniform quality SPM probe for non-contact/tapping mode/contact mode with 3 different AFM cantilevers

Manufacturer: NANOSENSORS

Coating: Reflective Gold
AFM tip shape: Circular symmetric
This probe features 3 cantilevers
F 90 kHz
C 0.3 N/m
L 40 µm
F 50 kHz
C 0.1 N/m
L 60 µm
F 30 kHz
C 0.06 N/m
L 80 µm
*nominal values
Applications
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The NANOSENSORS™ uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.

The unsurpassed uniformity of the mechanical characteristics of the uniqprobe series is particularly important for applications, where a large number of AFM probes with known and near identical force constants or resonance frequencies are needed. The sensors of the uniqprobe series are especially adapted for molecular biology, biophysics and quantitative nano-mechanical studies.

NANOSENORS™ qp-BioAC AFM probes are designed for mainly dynamic mode AFM imaging in air or liquid environments, but can also be used in contact mode. These AFM probes feature three different rectangular AFM cantilevers on one side of the support chip. The uniqprobe BioAC type unites fairly high resonance frequencies with low force constants. The combination of these characteristics leads to stable, low noise and fast measurements with reduced tip-sample interaction.

The AFM probe offers unique features:

  • small dispersion of force constant and resonance frequency 
  • typical AFM tip height 7µm 
  • typical AFM tip radius of curvature smaller than 10nm
  • stress free AFM cantilevers with considerably less bending
  • AFM tip and AFM cantilevers are made of a quartz-like material
  • reduced drift for applications in liquid environments
  • AFM tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)
  • chemically inert

This AFM probe features alignment grooves on the back side of the holder chip.

A chromium/gold layer of about 60nm is partially coating the AFM cantilever on the detector side near its free end where the AFM tip is situated. The main advantages of this partial metallic coating are considerably less AFM cantilever bending and reduced drift for SPM measurements in liquid environments.
AFM Tip:

  • 3 AFM Cantilevers:
    Cantilever 1
  • Beam
  • 0.3 N/m (0.15 - 0.55 N/m)*
  • 90 kHz (65 - 115 kHz)*
  • 40 µm (35 - 45 µm)*
  • 20 µm (18 - 22 µm)*
  • 400 nm ( 370 - 430 nm)*
  • Cantilever 2
  • Beam
  • 0.1 N/m (0.06 - 0.18 N/m)*
  • 50 kHz (35 - 65 kHz)*
  • 60 µm (55 - 65 µm)*
  • 25 µm (23 - 27 µm)*
  • 400 nm ( 370 - 430 nm)*
  • Cantilever 3
  • Beam
  • 0.06 N/m (0.03 - 0.09 N/m)*
  • 30 kHz (24 - 36 kHz)*
  • 80 µm (75 - 85 µm)*
  • 30 µm (28 - 32 µm)*
  • 400 nm ( 370 - 430 nm)*
  • * guaranteed range
    Interested in learning about how this AFM probe has been used by fellow researchers?
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