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HQ:NSC36/Pt

Order Code / Price*

Quantity

HQ:NSC36/Pt-15 Box of 15 AFM Probes

450 450.00 USD

Volume Discount Available [?]

HQ:NSC36/Pt-50 Box of 50 AFM Probes

1300 1300.00 USD

Your volume discount is 200.00 USD or 13.30%

HQ:NSC36/Pt-100 Box of 100 AFM Probes

2400 2400.00 USD

Your volume discount is 600.00 USD or 20.00%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

AFM probe with 3 different soft tapping mode AFM cantilevers by MikroMasch

AFM tip of MikroMasch AFM probe with 3 different soft tapping mode AFM cantilevers

SEM image of platinum coated AFM probe tip close-up

Schematic of three-lever NSC series MikroMasch AFM Probe

HQ:NSC36/Pt

Name: HQ:NSC36/Pt-15 AFM Probe with 3 Different Electrical, Force Modulation Mode AFM Cantilevers
Brand: MikroMasch
SKU: HQ:NSC36/Pt-15
Price: 450 USD
Availability: InStock

AFM Probe with 3 Different Electrical, Force Modulation Mode AFM Cantilevers

Manufacturer: MikroMasch

Coating: Electrically Conductive
AFM tip shape: Rotated

This probe features 3 cantilevers

F 90 kHz

C 1 N/m

L 110 µm

F 130 kHz

C 2 N/m

L 90 µm

F 65 kHz

C 0.6 N/m

L 130 µm

*nominal values

Applications

How to optimize AFM scan parameters

AFM probes of the 36 series have three different Force modulation mode AFM cantilevers on one side of the holder chip. They can be used for various electrical measurements.

AFM probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is about 30 nm.

The 30 nm conductive Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side of the AFM cantilever.

AFM Tip:

Shape: Rotated

Height: 15 µm (12 - 18 µm)*

Full Cone Angle: 40°

Radius: < 30 nm

3 AFM Cantilevers:

Cantilever A

Shape: Beam

Force Constant: 1 N/m (0.1 - 4.6 N/m)*

Resonance Frequency: 90 kHz (30 - 160 kHz)*

Length: 110 µm (105 - 115 µm)*

Width: 32.5 µm (29.5 - 35.5 µm)*

Thickness: 1 µm ( 0.5 - 1.5 µm)*

Cantilever B

Shape: Beam

Force Constant: 2 N/m (0.2 - 9 N/m)*

Resonance Frequency: 130 kHz (45 - 240 kHz)*

Length: 90 µm (85 - 95 µm)*

Width: 32.5 µm (29.5 - 35.5 µm)*

Thickness: 1 µm ( 0.5 - 1.5 µm)*

Cantilever C

Shape: Beam

Force Constant: 0.6 N/m (0.06 - 2.7 N/m)*

Resonance Frequency: 65 kHz (25 - 115 kHz)*

Length: 130 µm (125 - 135 µm)*

Width: 32.5 µm (29.5 - 35.5 µm)*

Thickness: 1 µm ( 0.5 - 1.5 µm)*

* typical range

Ferroelectric domains on Mg:LiNbO3 crystal

Piezoelectric Force Microscopy (PFM) image of a single crystal, z-cut, Mg:LiNbO3. Ferroelectric domains written by applying -100V to the tip. Blue and yellow areas correspond to positive and negative polariszed domains.

Scanned with a MikroMasch HQ:NSC36/Pt AFM probe, short cantilever on an NT-MDT Solaris system; 30 micron scan size

Image courtesy of Dr. Martin Lilienblum, PhD Student at the Department of Materials, ETH Zurich, Switzerland