AFM Probes »

HQ:DPER-XSC11

Order Code / Price*

Quantity

HQ:DPER-XSC11-15 Box of 15 AFM Probes

510 510.00 USD

Volume Discount Available [?]

HQ:DPER-XSC11-50 Box of 50 AFM Probes

1500 1500.00 USD

Your volume discount is 200.00 USD or 11.80%

HQ:DPER-XSC11-100 Box of 100 AFM Probes

2600 2600.00 USD

Your volume discount is 800.00 USD or 23.50%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

AFM cantilevers of 4 different applications AFM probe by MikroMasch

AFM tip of MikroMasch AFM probe with 4 different applications AFM cantilevers

AFM probe with 4 different applications AFM cantilevers by MikroMasch

SEM image of DPER AFM probe tip close-up

Schematic of four-lever XSC series MikroMasch AFM Probe

HQ:DPER-XSC11

Name: HQ:DPER-XSC11-15 AFM Probe with 4 Different Electrical AFM Cantilevers
Brand: MikroMasch
SKU: HQ:DPER-XSC11-15
Price: 510 USD
Availability: InStock

AFM Probe with 4 Different Electrical AFM Cantilevers

Manufacturer: MikroMasch

Coating: Electrically Conductive
AFM tip shape: Rotated

This probe features 4 cantilevers

F 15 kHz

C 0.2 N/m

L 500 µm

F 80 kHz

C 2.7 N/m

L 210 µm

F 155 kHz

C 7 N/m

L 150 µm

F 350 kHz

C 42 N/m

L 100 µm

*nominal values

Applications

How to optimize AFM scan parameters

AFM probes of the 11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used for various electrical measurements.

The DPER AFM probes are made by depositing a thin metal coating on Si AFM tips. The thickness of the coating on the flat AFM cantilever surface is about 15 nm, resulting in a coated AFM tip radius below 20 nm. The AFM probes can be used for imaging samples with higher resolution in XY directions.

The DPER AFM probes are made by depositing a thin Pt coating on both sides of the Si AFM cantilevers. The thickness of the coating on the flat AFM cantilever surface is about 15 nm.

AFM Tip:

Shape: Rotated

Height: 15 µm (12 - 18 µm)*

Full Cone Angle: 40°

Radius: < 20 nm

4 AFM Cantilevers:

Cantilever A

Shape: Beam

Force Constant: 0.2 N/m (0.1 - 0.4 N/m)*

Resonance Frequency: 15 kHz (12 - 18 kHz)*

Length: 500 µm (495 - 505 µm)*

Width: 30 µm (27 - 33 µm)*

Thickness: 2.7 µm ( 2.2 - 3.2 µm)*

Cantilever B

Shape: Beam

Force Constant: 2.7 N/m (1.1 - 5.6 N/m)*

Resonance Frequency: 80 kHz (60 - 100 kHz)*

Length: 210 µm (205 - 215 µm)*

Width: 30 µm (27 - 33 µm)*

Thickness: 2.7 µm ( 2.2 - 3.2 µm)*

Cantilever C

Shape: Beam

Force Constant: 7 N/m (3 - 16 N/m)*

Resonance Frequency: 155 kHz (115 - 200 kHz)*

Length: 150 µm (145 - 155 µm)*

Width: 30 µm (27 - 33 µm)*

Thickness: 2.7 µm ( 2.2 - 3.2 µm)*

Cantilever D

Shape: Beam

Force Constant: 42 N/m (17 - 90 N/m)*

Resonance Frequency: 350 kHz (250 - 465 kHz)*

Length: 100 µm (95 - 105 µm)*

Width: 50 µm (47 - 53 µm)*

Thickness: 2.7 µm ( 2.2 - 3.2 µm)*

* typical range