AFM cantilevers of the 18 series are optimal for Lift mode operation AFM since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM cantilevers are also used for mapping of materials properties in Force modulation mode and true topography imaging of the soft samples in Soft tapping mode.
High-resolution AFM probe with a hydrophobic diamond-like extratip at the apex of the silicon etched AFM probe.
This AFM probe features alignment grooves on the back side of the holder chip.
