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SSS-SEIHR

Order Code / Price*

Quantity

SSS-SEIHR-10 Box of 10 AFM Probes

900 900.00 USD

Volume Discount Available [?]

SSS-SEIHR-20 Box of 20 AFM Probes

1609 1609.00 USD

Your volume discount is 191.00 USD or 10.60%

SSS-SEIHR-50 Box of 50 AFM Probes

3550 3550.00 USD

Your volume discount is 950.00 USD or 21.10%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

Close-up view SEM image of SuperSharpSilicon AFM tip

SSS-SEIHR

Name: SSS-SEIHR-10 SuperSharp, Special Tapping Mode AFM Probe
Brand: NANOSENSORS
SKU: SSS-SEIHR-10
Price: 900 USD
Availability: InStock

SuperSharp, Special Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Reflective Aluminum
AFM tip shape: Supersharp

AFM Cantilever

F 130 kHz

C 15 N/m

L 225 µm

*nominal values

Applications

Supersharp AFM Probes

How to optimize AFM scan parameters

For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.

The AFM probe offers unique features:

excellent AFM tip radius of curvature
typical aspect ratio at 200 nm from AFM tip apex in the order of 4:1
highly doped silicon to dissipate static charge
high mechanical Q-factor for high sensitivity
precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Supersharp

Radius: < 2 nm (< 5 nm guaranteed)

Half Cone Angle: < 10° at 200 nm from apex

AFM Cantilever:

Shape: Beam

Force Constant: 15 N/m (5 - 37 N/m)*

Resonance Frequency: 130 kHz (96 - 175 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 33 µm (25 - 40 µm)*

Thickness: 5 µm ( 4 - 6 µm)*

* guaranteed range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.