SSS-NCLR

NANOSENSORS™ SSS-NCLR AFM probes are designed for non-contact mode or tapping mode AFM. They are offered as an alternative to the NANOSENSORS™ high frequency non contact type (NCH). The SSS-NCLR is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum AFM cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.

The AFM probe offers unique features:

• excellent AFM tip radius of curvature
• typical aspect ratio at 200 nm from AFM tip apex in the order of 4:1
• highly doped silicon to dissipate static charge
• high mechanical Q-factor for high sensitivity
• precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.