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PPP-QNCHR

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PPP-QNCHR-10 Box of 10 AFM Probes

760 760.00 USD

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

Front view SEM image of PointProbe® Plus AFM tip

Close-up view SEM image of PointProbe® Plus AFM tip

PPP-QNCHR

Name: PPP-QNCHR-10 Tapping Mode AFM Probe, for UHV Conditions
Brand: NANOSENSORS
SKU: PPP-QNCHR-10
Price: 760 USD
Availability: InStock

best of the best

Tapping Mode AFM Probe, for UHV Conditions

Manufacturer: NANOSENSORS

Coating: Reflective Aluminum
AFM tip shape: Standard

AFM Cantilever

F 330 kHz

C 42 N/m

L 125 µm

*nominal values

Applications

How to optimize AFM scan parameters

The PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminum coating on the detector side provide excellent resolution and an enhanced signal to noise ratio.

NANOSENSORS™ PPP-QNCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode) under UHV-conditions. Due to its high Q-factor and the typical features of the PPP series this AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

The AFM probe offers unique features:

excellent AFM tip radius of curvature
highly doped silicon to dissipate static charge
Al coating on detector side of AFM cantilever
chemically inert
excellent mechanical Q-factor under UHV conditions for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 7 nm (< 10 nm guaranteed)

AFM Cantilever:

Shape: Beam

Force Constant: 42 N/m (10 - 130 N/m)*

Resonance Frequency: 330 kHz (204 - 497 kHz)*

Length: 125 µm (115 - 135 µm)*

Width: 30 µm (22.5 - 37.5 µm)*

Thickness: 4 µm ( 3 - 5 µm)*

* guaranteed range