AFM Probes »

PPP-CONTSCR

Order Code / Price*

Quantity

PPP-CONTSCR-10 Box of 10 AFM Probes

381 381.00 USD

Volume Discount Available [?]

PPP-CONTSCR-20 Box of 20 AFM Probes

681 681.00 USD

Your volume discount is 81.00 USD or 10.60%

PPP-CONTSCR-50 Box of 50 AFM Probes

1503 1503.00 USD

Your volume discount is 402.00 USD or 21.10%

PPP-CONTSCR-W Box of 380 AFM Probes

7891 7891.00 USD

Your volume discount is 6587.00 USD or 45.50%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

Front view SEM image of PointProbe® Plus AFM tip

Close-up view SEM image of PointProbe® Plus AFM tip

PPP-CONTSCR

Name: PPP-CONTSCR-10 Contact Mode AFM Probe with Short AFM Cantilever
Brand: NANOSENSORS
SKU: PPP-CONTSCR-10
Price: 381 USD
Availability: InStock

Contact Mode AFM Probe with Short AFM Cantilever

Manufacturer: NANOSENSORS

Coating: Reflective Aluminum
AFM tip shape: Standard

AFM Cantilever

F 25 kHz

C 0.2 N/m

L 225 µm

*nominal values

Applications

How to optimize AFM scan parameters

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

The NANOSENSORS™ PPP-CONTSCR is an alternative AFM cantilever type for contact mode applications. The length of AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.

The AFM probe offers unique features:

excellent AFM tip radius of curvature
highly doped silicon to dissipate static charge
Al coating on detector side of AFM cantilever
high mechanical Q-factor for high sensitivity
precise alignment of the AFM cantilever position (within +/-2µm) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 7 nm (< 10 nm guaranteed)

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.01 - 1.87 N/m)*

Resonance Frequency: 25 kHz (1 - 57 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 48 µm (40 - 55 µm)*

Thickness: 1 µm ( 0.1 - 2 µm)*

* guaranteed range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.