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PPP-CONTSCAu

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Quantity

PPP-CONTSCAu-10 Box of 10 AFM Probes

457 457.00 USD

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

Front view SEM image of PointProbe® Plus AFM tip

Close-up view SEM image of PointProbe® Plus AFM tip

PPP-CONTSCAu

Name: PPP-CONTSCAu-10 Gold Coated Contact Mode AFM Probe with Short AFM Cantilever
Brand: NANOSENSORS
SKU: PPP-CONTSCAu-10
Price: 457 USD
Availability: InStock

Gold Coated Contact Mode AFM Probe with Short AFM Cantilever

Manufacturer: NANOSENSORS

Coating: Gold Overall
AFM tip shape: Standard

AFM Cantilever

F 25 kHz

C 0.2 N/m

L 225 µm

*nominal values

Applications

How to optimize AFM scan parameters

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

The NANOSENSORS™ PPP-CONTSCAu is an alternative AFM cantilever type for contact mode applications. The length of AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.

The AFM probe offers unique features:

metallic conductivity of the AFM tip
Au coating on both sides of the AFM cantilever
chemically inert
precise alignment of the AFM cantilever position (within +/-2µm) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This AFM probe features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts - the typical AFM tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.01 - 1.87 N/m)*

Resonance Frequency: 25 kHz (1 - 57 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 48 µm (40 - 55 µm)*

Thickness: 1 µm ( 0.1 - 2 µm)*

* guaranteed range