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NCHR

Order Code / Price*

Quantity

NCHR-10 Box of 10 AFM Probes

335 335.00 USD

Volume Discount Available [?]

NCHR-20 Box of 20 AFM Probes

600 600.00 USD

Your volume discount is 70.00 USD or 10.40%

NCHR-50 Box of 50 AFM Probes

1324 1324.00 USD

Your volume discount is 351.00 USD or 21.00%

NCHR-W Box of 380 AFM Probes

7050 7050.00 USD

Your volume discount is 5680.00 USD or 44.60%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

SEM image of PointProbe® Plus AFM tip

NCHR

Name: NCHR-10 Standard Tapping Mode AFM Probe
Brand: NanoWorld
SKU: NCHR-10
Price: 335 USD
Availability: InStock

the industry standard

Standard Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: Reflective Aluminum
AFM tip shape: Standard

AFM Cantilever

F 320 kHz

C 42 N/m

L 125 µm

*nominal values

Applications

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping™ mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent tip radius of curvature.

For applications requiring lower resonance frequencies or a AFM cantilever length exceeding 125 µm use NanoWorld Pointprobe® type NCLR.

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

AFM Tip:

Shape: Standard

Radius: < 8 nm (< 12 nm guaranteed)

AFM Cantilever:

Shape: Beam

Force Constant: 42 N/m (21 - 78 N/m)*

Resonance Frequency: 320 kHz (250 - 390 kHz)*

Length: 125 µm (120 - 130 µm)*

Width: 30 µm (25 - 35 µm)*

Thickness: 4 µm ( 3.5 - 4.5 µm)*

* typical range

AFM measurement of an onion epidermal cell with laser perforation (1)

We applied the formula of the elastic shell theory to successfully quantify the turgor pressure and cell wall elasticity of an onion epidermal cell using the cell curvature and apparent stiffness measured by AFM.
(A) Photographs of the cell measured before (left) and after (right) perforation. Yellow arrow indicates the perforation point. Cell lengths along long- and short- axes are denoted by La and Lb, respectively. Bars, 50 μm. (B) Topographic images before (left) and after (right) perforation. Measurement area corresponds to the dashed box area in (A). (C) Enlarged image of the perforation point. (D) Cross-sectional graph of the cell wall surface before (red line) and after (blue line) perforation. Bulge height of the cell surface is denoted by w. Dashed lines are curves for curvature calculated from Lb and w. (E) Quantities determined from AFM measurement. Mean curvature of the cell wall surface κM is calculated from La, Lb, and w.

Scanned with a NanoWorld NCHR AFM probe with 16 nm AFM tip radius for topography imaging on Bruker Nanowizard 4 AFM system (B,C).

Image courtesy of Dr.Yoichiro Hosokawa Nara Institute of Science and Technology

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.