AFM Probes »

Multi75Al-G

Order Code / Price*

Quantity

Multi75Al-G-10 Box of 10 AFM Probes

210 210.00 USD

Volume Discount Available [?]

Multi75Al-G-50 Box of 50 AFM Probes

890 890.00 USD

Your volume discount is 160.00 USD or 15.20%

Multi75Al-G-380 Box of 380 AFM Probes

4500 4500.00 USD

Your volume discount is 3480.00 USD or 43.60%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

Multi75Al-G Box of: max. 50 AFM Probes

Buy these AFM Probes together with other BudgetSensors AFM probes of your choice in a Budget Combo Box!

Side view SEM image of uncoated AFM tip r

Side view SEM image of AFM cantilever r

Front view SEM image of uncoated AFM tip

Multi75Al-G

Name: Multi75Al-G-10 Standard Force Modulation AFM Probe
Brand: BudgetSensors
SKU: Multi75Al-G-10
Price: 210 USD
Availability: InStock

best bang for your buck

Standard Force Modulation AFM Probe

Manufacturer: BudgetSensors

Coating: Reflective Aluminum
AFM tip shape: Rotated

AFM Cantilever

F 75 kHz

C 3 N/m

L 225 µm

*nominal values

Applications

How to optimize AFM scan parameters

Micromachined monolithic silicon AFM probe for force modulation (FM) and light tapping mode operation.

The consistent AFM tip radius of less than 10 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.

The AFM probe features a reflective aluminum coating on the back side of the AFM cantilever. For measurements in liquids please use the back side gold coated Multi75GD-G or the overall gold coated Multi75GB-G!

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.

Consistent high quality at a lower price!

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

AFM Tip:

Shape: Rotated

Height: 17 µm (15 - 19 µm)*

Setback: 15 µm (10 - 20 µm)*

Radius: < 10 nm

Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever:

Shape: Beam

Force Constant: 3 N/m (1 - 7 N/m)*

Resonance Frequency: 75 kHz (60 - 90 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 28 µm (23 - 33 µm)*

Thickness: 3 µm ( 2 - 4 µm)*

* typical range

Xantomonas Campestris bacteria in potato agar

The XC bacteria cause a number of diseases in plants. They are also used in the food industry to create the food additive xantham gum, a common thickening agent.

Scanned with a BudgetSensors Multi75Al-G AFM probe in light tapping mode, 10, 5 and 0.5 micron scan size

Image courtesy of Dr. Yordan Stefanov, Innovative Solutions Bulgaria