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MFMR

Order Code / Price*

Quantity

MFMR-10 Box of 10 AFM Probes

670 670.00 USD

Volume Discount Available [?]

MFMR-20 Box of 20 AFM Probes

1200 1200.00 USD

Your volume discount is 140.00 USD or 10.40%

MFMR-50 Box of 50 AFM Probes

2649 2649.00 USD

Your volume discount is 701.00 USD or 20.90%

MFMR-W Box of 380 AFM Probes

13917 13917.00 USD

Your volume discount is 11543.00 USD or 45.30%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

SEM image of PointProbe® Plus AFM tip

MFMR

Name: MFMR-10 Hard Magnetic, Medium Momentum MFM AFM Probe
Brand: NanoWorld
SKU: MFMR-10
Price: 670 USD
Availability: InStock

the industry standard

Hard Magnetic, Medium Momentum MFM AFM Probe

Manufacturer: NanoWorld

Coating: Magnetic
AFM tip shape: Standard

AFM Cantilever

F 75 kHz

C 2.8 N/m

L 225 µm

*nominal values

Applications

Magnetic AFM Probes

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

NanoWorld Pointprobe® MFM AFM probes are designed for magnetic force microscopy. The force constant and the special hard magnetic tip-side coating of the MFM type are optimised for this type of application. This type of AFM probe yields a very high force sensitivity, while simultaneously enabling tapping™ and lift mode operation.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers unique features:

excellent tip radius of curvature
high magnetic contrast and lateral resolution < 100 nm
electrically conductive coating

Soft magnetic samples may be influenced by the AFM tip magnetization!

This AFM probe features alignment grooves on the back side of the holder chip.

Hard Magnetic Coating / Aluminum Reflex Coating

The hard magnetic coating consists of a 40 nm thick cobalt alloy layer deposited on the tip side of the AFM cantilever which leads to a permanent magnetization of the tip with the direction usually along the tip axis. We recommend magnetizing the tip by means of a strong magnet (e.g. a NdFeB magnet, a few millimeters in size) prior to the measurement.

The aluminum reflex coating deposited on the detector side of the cantilever enhances the reflectance of the laser beam and prevents light from interfering within the cantilever.

As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 50 nm

AFM Cantilever:

Shape: Beam

Force Constant: 2.8 N/m (1.2 - 5.5 N/m)*

Resonance Frequency: 75 kHz (60 - 90 kHz)*

Length: 225 µm (220 - 230 µm)*

Width: 28 µm (22.5 - 32.5 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

* typical range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.