AFM Probes »

ElectriAll-In-One

Order Code / Price*

Quantity

AIOE-10 Box of 10 AFM Probes

280 280.00 USD

Volume Discount Available [?]

AIOE-50 Box of 50 AFM Probes

1200 1200.00 USD

Your volume discount is 200.00 USD or 14.30%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

ElectriAll-In-One Box of: max. 50 AFM Probes

Buy these AFM Probes together with other BudgetSensors AFM probes of your choice in a Budget Combo Box!

Close-up SEM image of All-In-One (AIO) AFM cantilevers C&D

Close-up front view SEM image of All-In-One (AIO) AFM cantilevers A&B

3D view of All-In-One (AIO) AFM cantilevers A&B

Side view SEM image of platinum (Pt) coated AFM tip

ElectriAll-In-One

Name: AIOE-10 Electrical AFM Probe with 4 Different AFM Cantilevers
Brand: BudgetSensors
SKU: AIOE-10
Price: 280 USD
Availability: InStock

Electrical AFM Probe with 4 Different AFM Cantilevers

Manufacturer: BudgetSensors

Coating: Electrically Conductive
AFM tip shape: Rotated

This probe features 4 cantilevers

F 15 kHz

C 0.2 N/m

L 500 µm

F 80 kHz

C 2.7 N/m

L 210 µm

F 150 kHz

C 7.4 N/m

L 150 µm

F 350 kHz

C 40 N/m

L 100 µm

*nominal values

Applications

How to optimize AFM scan parameters

Versatile micromachined monolithic silicon AFM probe with 4 different AFM cantilevers on a single holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode, and electric modes such as:

electrostatic force microscopy (EFM)
Kelvin probe force microscopy (KPFM)
scanning capacitance microscopy (SCM)
piezoresponse force microscopy (PFM)

The main advantage of the All-In-One series compared to single-cantilever AFM probes is the freedom to choose the right AFM cantilever for each application on the fly, thus avoiding the need to stock various AFM probe types.

The consistent AFM tip radius of less than 25 nm ensures high resolution and good reproducibility. The rotated AFM tips provide more symmetric representation of high sample features.

The AFM probe features an overall chromium-platinum coating.

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems. There are 2 AFM cantilevers on each end of the chip. The end of the chip with the two shorter, stiffer and higher resonance frequency AFM cantilevers is marked by a trapezoidal pattern visible with the naked eye.

BudgetSensors offers consistent high quality at a lower price!

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip:

Shape: Rotated

Height: 17 µm (15 - 19 µm)*

Setback: 15 µm (10 - 20 µm)*

Radius: < 25 nm

Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

4 AFM Cantilevers:

Cantilever A - Contact Mode

Shape: Beam

Force Constant: 0.2 N/m (0.04 - 0.7 N/m)*

Resonance Frequency: 15 kHz (10 - 20 kHz)*

Length: 500 µm (490 - 510 µm)*

Width: 30 µm (25 - 35 µm)*

Thickness: 2.7 µm ( 1.7 - 3.7 µm)*

Cantilever B - Force Modulation

Shape: Beam

Force Constant: 2.7 N/m (0.4 - 10 N/m)*

Resonance Frequency: 80 kHz (50 - 110 kHz)*

Length: 210 µm (200 - 220 µm)*

Width: 30 µm (25 - 35 µm)*

Thickness: 2.7 µm ( 1.7 - 3.7 µm)*

Cantilever C - Soft Tapping

Shape: Beam

Force Constant: 7.4 N/m (1 - 29 N/m)*

Resonance Frequency: 150 kHz (70 - 230 kHz)*

Length: 150 µm (140 - 160 µm)*

Width: 30 µm (25 - 35 µm)*

Thickness: 2.7 µm ( 1.7 - 3.7 µm)*

Cantilever D - Tapping Mode

Shape: Beam

Force Constant: 40 N/m (7 - 160 N/m)*

Resonance Frequency: 350 kHz (200 - 500 kHz)*

Length: 100 µm (90 - 110 µm)*

Width: 50 µm (45 - 55 µm)*

Thickness: 2.7 µm ( 1.7 - 3.7 µm)*

* typical range