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EFM

Order Code / Price*

Quantity

EFM-10 Box of 10 AFM Probes

457 457.00 USD

Volume Discount Available [?]

EFM-20 Box of 20 AFM Probes

819 819.00 USD

Your volume discount is 95.00 USD or 10.40%

EFM-50 Box of 50 AFM Probes

1806 1806.00 USD

Your volume discount is 479.00 USD or 21.00%

EFM-W Box of 380 AFM Probes

9614 9614.00 USD

Your volume discount is 7752.00 USD or 44.60%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

SEM image of PointProbe® Plus AFM tip

EFM

Name: EFM-10 Electrical, Force Modulation AFM Probe
Brand: NanoWorld
SKU: EFM-10
Price: 457 USD
Availability: InStock

the industry standard

Electrical, Force Modulation AFM Probe

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Standard

AFM Cantilever

F 75 kHz

C 2.8 N/m

L 225 µm

*nominal values

Applications

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

NanoWorld Pointprobe® EFM AFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of AFM probe yields a very high force sensitivity, while simultaneously enabling tapping^™ and lift mode operation.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM tip offers an excellent tip radius of curvature.

This AFM probe features alignment grooves on the back side of the holder chip.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 25 nm

AFM Cantilever:

Shape: Beam

Force Constant: 2.8 N/m (1.2 - 5.5 N/m)*

Resonance Frequency: 75 kHz (60 - 90 kHz)*

Length: 225 µm (220 - 230 µm)*

Width: 28 µm (22.5 - 32.5 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

* typical range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.