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Micromachined monolithic silicon AFM probe for contact mode and lateral force microscopy (LFM) operation.
The consistent AFM tip radius of less than 10 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.
The AFM probe features a reflective aluminum coating on the back side of the AFM cantilever. For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!
With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.
Consistent high quality at a lower price!
This AFM probe features alignment grooves on the back side of the holder chip.
Topography and 3D topography images of SrTiO3 single crystal substrate
Scanned with a BudgetSensors ContAl-G AFM probe in contact mode, 5 micron scan size
Image courtesy of Prof. Yunseok Kim Sungkyunkwan University, South Korea
Topography and 3D topography images of polycrystalline SrTiO3 single crystal substrate
Scanned with a BudgetSensors ContAl-G AFM probe in contact mode, 5 micron scan size
Image courtesy of Prof. Yunseok Kim, Sungkyunkwan University, South Korea
Contact mode topography image rendered in 3D and overlaid with the Lateral Force Microscopy image showing nicely the scales’ morphology as well as some hairspray droplets.
Scanned with a BudgetSensors ContAl-G AFM probe, 40 micron scan size
Image courtesy of Dr. Yordan Stefanov, Innovative Solutions Bulgaria
Topography image of human platelet acquired at room temperature
Scanned with a BudgetSensors ContAl-G AFM probe, 6 micron scan size
Image courtesy of Dr. Tonya Andreeva, Institute of Biophysics and Biomedical Engineering, BAS