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CDT-FMR

Order Code / Price*

Quantity

CDT-FMR-10 Box of 10 AFM Probes

1759 1759.00 USD

Volume Discount Available [?]

CDT-FMR-20 Box of 20 AFM Probes

3148 3148.00 USD

Your volume discount is 370.00 USD or 10.50%

CDT-FMR-50 Box of 50 AFM Probes

6945 6945.00 USD

Your volume discount is 1850.00 USD or 21.00%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

SEM image of DT diamond coated AFM tip

Raman spectrum of diamond AFM tip coating

CDT-FMR

Name: CDT-FMR-10 Diamond Coated, Conductive Force Modulation AFM Probe
Brand: NANOSENSORS
SKU: CDT-FMR-10
Price: 1759 USD
Availability: InStock

best of the best

Diamond Coated, Conductive Force Modulation AFM Probe

Manufacturer: NANOSENSORS

Coating: Diamond,Conductive Diamond
AFM tip shape: Standard

AFM Cantilever

F 105 kHz

C 6.2 N/m

L 225 µm

*nominal values

Applications

How to optimize AFM scan parameters

NANOSENSORS™ CDT-FMR AFM probes are designed for force modulation microscopy. The force constant of this AFM probe type spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The FM sensor serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM probe but with reduced operation stability.

For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic AFM tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

The AFM probe offers unique features:

real diamond coating, highly doped
high mechanical Q-factor for high sensitivity
precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
compatible with PointProbe^®Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

AFM Cantilever:

Shape: Beam

Force Constant: 6.2 N/m (1.5 - 18.3 N/m)*

Resonance Frequency: 105 kHz (65 - 155 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 27.5 µm (20 - 35 µm)*

Thickness: 3 µm ( 2 - 4 µm)*

* guaranteed range

OCAs SAM layer

Magneto-Conductive AFM (mC-AFM) measurements of Self-assembled monolayer (SAM) of overcrowded alkenes (OCAs) with ferromagnetic substrate. The Ni layer on the substrate worked as bottom electrode, and was magnetized by permanent magnet with maximum field ≈260mT under the substrate. A motor connected to the magnet rotated the magnet orientation externally, allowing to measure I-V profile of the SAM without moving the tip x-y location between up and down magnetization. After measuring ≥50 I–V curves with positive magnetic field, the AFM tip was lifted 40nm above the surface and the permanent magnet was rotated by 180°to apply negative magnetic field, immediately moving to the next measurement with negative field. Electric current was measured in contact mode by sweeping the bias voltage in the range ±1V. The applied force between the tip and the sample was kept at 180-190nN to avoid damage to the molecules. ≥50 I-V curves were averaged for each chirality-rotation step and two magnetic orientations.

Scanned with a NANOSENSORS CDT-FMR AFM probe on a Bruker Dimension Icon XR AFM system in PFT and contact mode.

Image courtesy of Dr. Taketoshi Minato, Institute for Molecular Science, National Institutes of Natural Sciences

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.