Rectangular / Diving Board AFM Cantilevers
AFM probes with rectangular / diving board AFM cantilevers
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397 results
New
biosphere B2000-FM
Pre-calibrated EBD nanoindentation AFM probe
Coating:
Reflective Gold
Tip Shape: Sphere, Diamond-Like-Carbon
Sphere Diameter: 4 µm
Tip Shape: Sphere, Diamond-Like-Carbon
Sphere Diameter: 4 µm
AFM Cantilever:
F
75 kHz
C
2.8 N/m
L
225 µm
New
biosphere B2000-CONT
Pre-calibrated EBD nanoindentation AFM probe
Coating:
Reflective Gold
Tip Shape: Sphere, Diamond-Like-Carbon
Sphere Diameter: 4 µm
Tip Shape: Sphere, Diamond-Like-Carbon
Sphere Diameter: 4 µm
AFM Cantilever:
F
13 kHz
C
0.2 N/m
L
450 µm
HR-MFM-225C0_7-ML3-R
Hard magnetic AFM probe
Coating:
Magnetic
Tip Shape: Cone Shaped
Tip Shape: Cone Shaped
AFM Cantilever:
F
45 kHz
C
0.7 N/m
L
225 µm
HR-MFM-225C3_0-ML1-R
Hard magnetic AFM probe
Coating:
Magnetic
Tip Shape: Cone Shaped
Tip Shape: Cone Shaped
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
HR-MFM-225C3_0-ML3-R
Coating:
Magnetic
Tip Shape: Cone Shaped
Tip Shape: Cone Shaped
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
Q-WM190-SSS
Premounted, SuperSharp Tapping Mode AFM Probe with Long AFM Cantilever, for Quesant/Ambios AFM systems
Coating:
Reflective Aluminum
Tip Shape: Supersharp
Tip Shape: Supersharp
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
Q-AR5
Premounted High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever, for Quesant/Ambios AFM systems
Coating:
Reflective Aluminum
Tip Shape: High-Aspect-Ratio
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
Q-WM300
Premounted Standard Tapping Mode AFM Probe, for Quesant/Ambios AFM systems
Coating:
Reflective Aluminum
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
300 kHz
C
40 N/m
L
125 µm
Q-CONT
Premounted Standard Contact Mode AFM Probe, for Quesant/Ambios AFM systems
Coating:
Reflective Aluminum
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
13 kHz
C
0.2 N/m
L
450 µm
Q-EFM
Premounted Electrical, Force Modulation AFM Probe, for Quesant/Ambios AFM systems
Coating:
Electrically Conductive
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
Q-MFM
Premounted Hard Magnetic, Medium Momentum MFM AFM Probe, for Quesant/Ambios AFM systems
Coating:
Magnetic
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
Q-Cond-E
Premounted Electrical, Contact Mode AFM Probe, for Quesant/Ambios AFM systems
Coating:
Electrically Conductive
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
13 kHz
C
0.2 N/m
L
450 µm
Q-WM75
Premounted Standard Force Modulation AFM Probe, for Quesant/Ambios AFM Systems
Coating:
Reflective Aluminum
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
Q-WM150
Premounted Soft Tapping Mode AFM Probe, for Quesant/Ambios AFM systems
Coating:
Reflective Aluminum
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilever:
F
150 kHz
C
5 N/m
L
125 µm
best bang for your buck
Q-WM190
Premounted Tapping Mode AFM Probe with Long AFM Cantilever, for Quesant/Ambios AFM systems
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
HR-MFM-225C0_7-ML1-R
Hard magnetic AFM probe
Coating:
Magnetic
Tip Shape: Cone Shaped
Tip Shape: Cone Shaped
AFM Cantilever:
F
45 kHz
C
0.7 N/m
L
225 µm
NANOSENSORS™ Special Developments List (SDL)
Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise
Coating:
various
Tip Shape: various
Tip Shape: various
