NanoAndMore Logo
Choose a different region
  • NanoAndMore USA
  • NanoAndMore Japan
  • NanoAndMore SE Asia
NanoAndMore GmbH does not ship to your country.
Log in
Register
0 Shopping Cart
View Shopping Cart
[ Your cart is empty. ] 0.00
Please note:

NanoAndMore GmbH does not ship to your country

You can switch to our colleagues from from the top of the page.

globe logo xs
  • Log in
    Register
  • 0 Shopping Cart
    View Shopping Cart
    [ Your cart is empty. ] 0.00
  • AFM Probes Catalog
  • AFM Info
  • AFM Accessories
  • SEM/Other Products
  • News
  • Contact
AFM Probes  »  
Platinum Coated AFM Cantilevers
Reset
AFM Probe Filter
cat-icon
cat-icon
cat-icon
Electrically Conductive
Beam
Related Categories
  • Rotated AFM Tips
  • AFM Tips at the Very End of the AFM Cantilever
  • 3-sided Sharpened Pyramidal AFM Tips
  • Silicon AFM Tips
  • Platinum Coated AFM Tips
  • Rectangular / Diving Board AFM Cantilevers
  • Rectangular Cross Section AFM Cantilevers
  • Trapezoidal Cross Section AFM Cantilevers (tip on narrow flank)
  • Silicon AFM Cantilevers
  • 1 Single AFM Cantilever per AFM Probe
  • 3 AFM Cantilevers on One Side of the AFM Probe
  • 4 AFM Cantilevers per AFM Probe (2 Cantilevers on Each Side of Chip)
  • Platinum Coated AFM Cantilevers
  • 3.4 mm x 1.6 mm AFM Support Chips
  • 315 µm Thick AFM Support Chips

Platinum Coated AFM Cantilevers

AFM probes with platinum coated AFM cantilevers
Sort by:
22 results
Q-EFM BudgetSensors
Q-EFM
Premounted Electrical, Force Modulation AFM Probe, for Quesant/Ambios AFM systems
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
75 kHz
C
3 N/m
L
225 µm
Q-Cond-E BudgetSensors
Q-Cond-E
Premounted Electrical, Contact Mode AFM Probe, for Quesant/Ambios AFM systems
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilever:
F
13 kHz
C
0.2 N/m
L
450 µm
2
  • <
  • 1
  • 2
No more results
Loading
nanosensors-logo
nanoworld-logo
budgetsensors-logo
mikromasch-logo
opus-logo
sqube-logo
nanotools-logo
AFM Probes
  • Non-Contact / Standard Tapping Mode AFM Probes
  • Non-Contact / Soft Tapping Mode AFM Probes
  • Fluid Tapping AFM Probes
  • Hardened / Enhanced Wear Resistance Tapping AFM Probes
  • High Quality Factor AFM Cantilevers
  • Force Modulation (FM) AFM Probes
  • Contact Mode AFM Probes
  • Life Science AFM Probes
  • Ultra High Frequency AFM Probes
  • Conductive AFM Probes
  • Magnetic AFM Probes
  • Supersharp AFM Probes
  • Diamond AFM Probes
  • Hardened / Enhanced Wear Resistance AFM Probes
  • Nanoindentation and Lithography AFM Probes
  • High Aspect Ratio (HAR) AFM Probes
  • PeakForce Tapping® AFM Probes
  • PeakForce Kelvin Probe Force Microscopy AFM Probes
  • PeakForce TUNA™ AFM Probes
  • PeakForce Quantitative Nanomechanics AFM Probes
  • PeakForce QNM High-Accuracy AFM Probes
  • ScanAsyst®** AFM Probes
  • Silicon Nitride AFM Probes
  • Lateral Force Microscopy (LFM) AFM Probes
  • Tipless AFM Cantilevers and Cantilever Arrays
  • Self-Sensing & Self-Actuating AFM Probes
  • Sphere AFM Tips and Colloidal AFM Probes by sQube
  • Platinum Silicide AFM Probes
  • OMCL-AC160TS Replacement AFM Probes
  • OMCL-AC240TS Replacement AFM Probes
  • OMCL-AC200TS Replacement AFM Probes
  • OMCL-AC55TS Replacement AFM Probes
  • OMCL-AC240TM Replacement AFM Probes
  • OMCL-TR800PSA Replacement AFM Probes
  • Original and unaltered OLYMPUS AFM probes
  • Premounted AFM Probes
AFM Probes Info
  • AFM Tips
  • AFM Cantilevers
  • AFM Support Chips
  • Special AFM Probes
  • How to Optimize AFM Scan Parameters
  • AFM Probe Videos
  • AFM Image Gallery
More Products
  • AFM Accessories
  • Other Products
Online Shop
  • Monthly promotion
  • Disclaimer
  • How to buy
  • Profile/Registration
  • Terms and Conditions
  • Privacy
Information
  • News
  • Links
  • Contact
  • Impressum
** ScanAsyst® and PeakForce Tapping™ are trademarks of Bruker Corporation
*** OLYMPUS® is a trademark of Olympus Corporation