By simply buying larger package sizes of Team Nanotec AFM probes, you automatically get a built-in quantity discount compared to the smallest packaging size.
ISNE
AFM Probe Tip characterizer: Sharp Silicon "Nanoedge" with Steep Slope
Product Description
Layout: 88 cells on 1 x 1 mm area on 6 x 6 silicon chip
Specifications:
- Edge recessed against top surface
- Material: Silicon
- Usable edge length: 1 to 2µm
- Top edge radius: < 10 nm
- Edge width variation: < 3 nm
- Upper slope angle: < 8°
Special layout makes it easy, to return with a tip always to the identical characterizer position. Many identical sites on a single characterizer chip help to increase lifetime.
Give us your feedback
Did we miss any relevant information of this product?
Did you find this or a comparable product for a better price?
