By simply buying larger package sizes of Advanced Surface Microscopy, Inc. AFM probes, you automatically get a built-in quantity discount compared to the smallest packaging size.
301BE
Calibration Specimen, 1-dimensional, 292nm Nominal Period, Ti on Si
Product Description
301BE Calibration Specimen, 1-dimensional, 292 nm nominal period (refer to calibration certificate for actual pitch), Ti on Si Substrate: Silicon about 4x3 mm Default mounting: Unmounted
Available mounted on 12 or 15 mm diam. steel disk on request.
Available mounted on SEM stub (301BE-SEM).
Default SEM mounting: on pin stub type A using colloidal graphite paint.
Colloidal silver paint or adhesive carbon tab available on request.
