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Order Code / Price*
Quantity
OTESPA-10 Box of 10 AFM Probes
295.00 EUR
OTESPA-50 Box of 50 AFM Probes
1100.00 EUR
Your volume discount is 375.00 EUR or 25.40%
OTESPA-100 Box of 100 AFM Probes
1880.00 EUR
Your volume discount is 1070.00 EUR or 36.30%
Product availability: On stock
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OTESPA

Standard Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Reflective Aluminum
AFM tip shape: Optimized Positioning
AFM Cantilever
F 300 kHz
C 26 N/m
L 160 µm
*nominal values
Applications
How to optimize AFM scan parameters gear icon
The OTESPA is designed for standard AC mode AFM imaging in air or vacuum. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

This AFM probe features alignment grooves on the back side of the holder chip.

30 nm Al on the back side of the cantilever
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 26 N/m (8 - 57 N/m)*
  • 300 kHz (200 - 400 kHz)*
  • 160 µm (150 - 170 µm)*
  • 40 µm (38 - 42 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range
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