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Quantity
OLTESPA-10 Box of 10 AFM Probes
295.00 EUR
OLTESPA-50 Box of 50 AFM Probes
1100.00 EUR
Your volume discount is 375.00 EUR or 25.40%
OLTESPA-100 Box of 100 AFM Probes
1880.00 EUR
Your volume discount is 1070.00 EUR or 36.30%
Product availability: On stock
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OLTESPA

Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Reflective Aluminum
AFM tip shape: Optimized Positioning
AFM Cantilever
F 70 kHz
C 2 N/m
L 240 µm
*nominal values
Applications
How to optimize AFM scan parameters gear icon
The OLTESPA is designed for AC mode AFM imaging of soft samples. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

This AFM probe features alignment grooves on the back side of the holder chip.

30 nm Al on the back side of the cantilever
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 2 N/m (0.6 - 3.9 N/m)*
  • 70 kHz (45 - 90 kHz)*
  • 240 µm (230 - 250 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.6 µm ( 2.1 - 3.1 µm)*
  • * typical range
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