AFM Probes »

3XC-NA

Order Code / Price*

Quantity

3XC-NA-10 Box of 10 AFM Probes

320 320.00 EUR

Volume Discount Available [?]

3XC-NA-24 Box of 24 AFM Probes

620 620.00 EUR

Your volume discount is 148.00 EUR or 19.30%

3XC-NA-50 Box of 50 AFM Probes

1200 1200.00 EUR

Your volume discount is 400.00 EUR or 25.00%

3XC-NA-100 Box of 100 AFM Probes

1990 1990.00 EUR

Your volume discount is 1210.00 EUR or 37.80%

Product availability: On stock

SEM image of OPUS 3XC AFM cantilevers and AFM tips

SEM image of OPUS 3XC AFM probe middle AFM cantilever and AFM tip

Side view SEM image of Opus uncoated AFM tip

Side View SEM image of Opus uncoated AFM tip

3XC-NA

Name: 3XC-NA-10 AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM Tips at the Very End of the AFM Cantilevers
Brand: OPUS by MikroMasch
SKU: 3XC-NA-10
Price: 320 EUR
Availability: InStock

top value

AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM Tips at the Very End of the AFM Cantilevers

Manufacturer: OPUS by MikroMasch

Coating: Reflective Aluminum
AFM tip shape: Optimized Positioning

This probe features 3 cantilevers

F 17 kHz

C 0.3 N/m

L 500 µm

F 150 kHz

C 9 N/m

L 175 µm

F 75 kHz

C 2.5 N/m

L 240 µm

*nominal values

Applications

How to optimize AFM scan parameters

The 3XC series of AFM probes features three different AFM cantilevers for various measurement modes:

500DC - Contact mode AFM cantilever
200AC - Standard tapping mode AFM cantilever
240AC - Soft tapping mode AFM cantilever

The uncoated AFM tips offer sharp AFM tip apexes and chemical inertness. The back side aluminum coating significantly enhances the AFM cantilever reflectivity in air and UHV.

The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface.

30 nm Al on the back side of the cantilever

AFM Tip:

Shape: Optimized Positioning

Height: 14 µm (12 - 16 µm)*

Setback: 0 µm

Radius: < 7 nm

Half Cone Angle: 0° front, 35° back, <9° side

3 AFM Cantilevers:

Contact mode cantilever

Shape: Beam

Force Constant: 0.3 N/m (0.1 - 0.6 N/m)*

Resonance Frequency: 17 kHz (11 - 22 kHz)*

Length: 500 µm (490 - 510 µm)*

Width: 30 µm (28 - 32 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

Standard tapping mode cantilever

Shape: Beam

Force Constant: 9 N/m (2.8 - 21 N/m)*

Resonance Frequency: 150 kHz (100 - 200 kHz)*

Length: 175 µm (165 - 185 µm)*

Width: 40 µm (38 - 42 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

Soft tapping mode cantilever

Shape: Beam

Force Constant: 2.5 N/m (0.75 - 5.3 N/m)*

Resonance Frequency: 75 kHz (50 - 100 kHz)*

Length: 240 µm (230 - 250 µm)*

Width: 30 µm (28 - 32 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

* typical range