AFM Probes »

HQ:NSC16/Al BS

Order Code / Price*

Quantity

HQ:NSC16/Al BS-15 Box of 15 AFM Probes

320 320.00 EUR

Volume Discount Available [?]

HQ:NSC16/Al BS-50 Box of 50 AFM Probes

900 900.00 EUR

Your volume discount is 166.67 EUR or 15.60%

HQ:NSC16/Al BS-100 Box of 100 AFM Probes

1700 1700.00 EUR

Your volume discount is 433.33 EUR or 20.30%

HQ:NSC16/Al BS-200 Box of 200 AFM Probes

3200 3200.00 EUR

Your volume discount is 1066.67 EUR or 25.00%

HQ:NSC16/Al BS-400 Box of 400 AFM Probes

4990 4990.00 EUR

Your volume discount is 3543.33 EUR or 41.50%

Product availability: On stock

AFM tip of MikroMasch long-cantilever tapping mode AFM probe

AFM cantilever of MikroMasch long-cantilever tapping mode AFM probe

SEM image of MikroMasch general purpose AFM probe tip close-up

Schematic of single lever MikroMasch AFM Probe

HQ:NSC16/Al BS

Name: HQ:NSC16/Al BS-15 Tapping Mode AFM Probe with Long AFM Cantilever
Brand: MikroMasch
SKU: HQ:NSC16/Al BS-15
Price: 320 EUR
Availability: InStock

Tapping Mode AFM Probe with Long AFM Cantilever

Manufacturer: MikroMasch

Coating: Reflective Aluminum
AFM tip shape: Rotated

AFM Cantilever

F 190 kHz

C 45 N/m

L 225 µm

*nominal values

Applications

Non-Contact / Standard Tapping Mode AFM Probes

How to optimize AFM scan parameters

AFM cantilevers of the 16 series with high spring constant and low resonance frequency (below 250 kHz) can be used in tapping mode in SPM that has a low-frequency feedback loop. These AFM cantilevers also fit SPM systems that do not support AFM probes with short lever arms.

This AFM probe features alignment grooves on the back side of the holder chip.

Back side Al coated. Coating thickness - 30 nm.

AFM Tip:

Shape: Rotated

Height: 15 µm (12 - 18 µm)*

Full Cone Angle: 40°

Radius: < 8 nm

AFM Cantilever:

Shape: Beam

Force Constant: 45 N/m (30 - 70 N/m)*

Resonance Frequency: 190 kHz (170 - 210 kHz)*

Length: 225 µm (220 - 230 µm)*

Width: 37.5 µm (34.5 - 40.5 µm)*

Thickness: 7 µm ( 6.5 - 7.5 µm)*

* typical range

AFM nanolithography and topography measurements

HQ:NSC16 series AFM probes are used for AFM nanolithography and topography measurements

Scanned with a MikroMasch HQ:NSC16/Al BS